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2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE) (1996)
White Plains, New York
Oct. 30, 1996 to Nov. 2, 1996
ISSN: 1071-9458
ISBN: 0-8186-7707-4
TABLE OF CONTENTS
A6: Panel: How Can Software Reliability Engineering (SRE) Help System Engineers and Software Architects?

Reviewers (PDF)

pp. xvi
B1: Fault/Failure Detection: Session Chair: C. Wohlin

Automatic failure detection with Conditional-Belief supervisors (Abstract)

J.J. Li , Bell Canada Software Reliability Lab., Waterloo Univ., Ont., Canada
R.E. Seviora , Bell Canada Software Reliability Lab., Waterloo Univ., Ont., Canada
pp. 4

Analyze-NOW-an environment for collection and analysis of failures in a network of workstations (Abstract)

B.K. Iyer , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
A. Thakur , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 14

Towards automation of checklist-based code-reviews (Abstract)

R. Crisan , Dept. of Electr. & Electron. Eng., Paderborn Univ., Germany
F. Belli , Dept. of Electr. & Electron. Eng., Paderborn Univ., Germany
pp. 24
A2: Operational Profile/Failure: Session Chair: J.-C. Laprie

Sensitivity of reliability growth models to operational profile errors (Abstract)

A.N. Crespo , Dept. of Comput. Sci., UNICAMP, Campinas, Brazil
P. Matrella , Dept. of Comput. Sci., UNICAMP, Campinas, Brazil
A. Pasquini , Dept. of Comput. Sci., UNICAMP, Campinas, Brazil
pp. 35

On reducing the sensitivity of software reliability to variations in the operational profile (Abstract)

B. Cukic , Dept. of Comput. Sci., Houston Univ., TX, USA
F.B. Bastani , Dept. of Comput. Sci., Houston Univ., TX, USA
pp. 45

Avionics software problem occurrence rates (Abstract)

M.L. Shooman , Dept. of Comput. Sci., Polytechnic Univ., Brooklyn, NY, USA
pp. 55
B2: Test Generation: Session Chair: J. Slonim

Automatic test generation for predicates (Abstract)

K.C. Tai , Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
M.A. Vouk , Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
A. Paradkar , Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
pp. 66

Object state testing and fault analysis for reliable software systems (Abstract)

Y. Toyoshima , Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
C. Chen , Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
D. Kung , Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
N. Venugopalan , Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
P. Hsia , Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
J. Gao , Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
Y. Lu , Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
pp. 76
C2: Reliable Systems I: Session Chair: H. Levendel

Residual fault density prediction using regression methods (Abstract)

J.A. Morgan , Sch. of Comput. Sci., DePaul Univ., Chicago, IL, USA
G.J. Knafl , Sch. of Comput. Sci., DePaul Univ., Chicago, IL, USA
pp. 87

Integrating metrics and models for software risk assessmen (Abstract)

J.P. Hudepohl , Nortel, Research Triangle Park, NC, USA
S.J. Aud , Nortel, Research Triangle Park, NC, USA
J. Mayrand , Nortel, Research Triangle Park, NC, USA
E.B. Allen , Nortel, Research Triangle Park, NC, USA
T.M. Khoshgoftaar , Nortel, Research Triangle Park, NC, USA
pp. 93

Assessing the reliability impacts of software fault-tolerance mechanisms (Abstract)

V.B. Mendiratta , Bell labs., Lucent Technol., Naperville, IL, USA
pp. 99

Design of reliable software via general combination of N-version programming and acceptance testing (Abstract)

B. Parhami , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 104
B3: Testing: Session Chair: W. Howden

Integration Testing Using Interface Mutation (Abstract)

Aditya P. Mathur , Purdue University
Marcio E. Delamaro , University of Sao Paulo, Sao Carlos 13560, Brazil
Jose C. Maldonado , University of Sao Paulo, Sao Carlos 13560, Brazil
pp. 112

Task decomposition testing and metrics for concurrent programs (Abstract)

Wei-Chuan Lin , Graduate Inst. of Inf. Eng., TamKang Univ., Taipei, Taiwan
Ying-Hong Wang , Graduate Inst. of Inf. Eng., TamKang Univ., Taipei, Taiwan
Ying-Feng Kou , Graduate Inst. of Inf. Eng., TamKang Univ., Taipei, Taiwan
Chi-Ming Chung , Graduate Inst. of Inf. Eng., TamKang Univ., Taipei, Taiwan
T.K. Shih , Graduate Inst. of Inf. Eng., TamKang Univ., Taipei, Taiwan
pp. 122
C3: Reliable Systems II: Session Chair: J. Dugan

Software reliability models: an approach to early reliability prediction (Abstract)

C. Smidts , Maryland Univ., College Park, MD, USA
M. Stutzke , Maryland Univ., College Park, MD, USA
R.W. Stoddard , Maryland Univ., College Park, MD, USA
pp. 132

Designing reliable systems from reliable components using the context-dependent constraint concept (Abstract)

P. Molin , Dept. of Comput. Sci. & Bus. Adm., Univ. Coll. of Karlskrona, Ronneby, Sweden
pp. 142

Using the genetic algorithm to build optimal neural networks for fault-prone module detection (Abstract)

J.P. Hudepohl , Dept. of Comput. Sci., Florida Atlantic Univ., Boca Raton, FL, USA
E.B. Allen , Dept. of Comput. Sci., Florida Atlantic Univ., Boca Raton, FL, USA
T.M. Khoshgoftaar , Dept. of Comput. Sci., Florida Atlantic Univ., Boca Raton, FL, USA
R. Hochman , Dept. of Comput. Sci., Florida Atlantic Univ., Boca Raton, FL, USA
pp. 152
B4: Fault Injection: Session Chair: K. Kanoun

Using fault injection to increase software test coverage (Abstract)

J.M. Bieman , Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
D. Dreilinger , Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
Lijun Lin , Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
pp. 166

Error injection aimed at fault removal in fault tolerance mechanisms-criteria for error selection using field data on software faults (Abstract)

P. Santhanam , Dept. of Comput. Sci., Chalmers Univ. of Technol., Goteborg, Sweden
J. Christmansson , Dept. of Comput. Sci., Chalmers Univ. of Technol., Goteborg, Sweden
pp. 175

Comparing disk and memory's resistance to operating system crashes (Abstract)

P.M. Chen , Dept. of Electr. & Comput. Eng., Michigan Univ., MI, USA
C.M. Aycock , Dept. of Electr. & Comput. Eng., Michigan Univ., MI, USA
G. Rajamani , Dept. of Electr. & Comput. Eng., Michigan Univ., MI, USA
Wee Teck Ng , Dept. of Electr. & Comput. Eng., Michigan Univ., MI, USA
pp. 182
A5: SRE Experience; Session Chair: W. Farr

Validating software architectures for high reliability (Abstract)

P. Verma , .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
H.H. Park , .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
R. Chan , .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
W.J. Donnelly , .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
W.K. Ehrlich , .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
M.B. Saltzman , .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
pp. 196

Reliability of a commercial telecommunications system (Abstract)

M. Kaaniche , Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
K. Kanoun , Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
pp. 207

Reliability and availability of a wide area network-based education system (Abstract)

D.L. Bitzer , Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
M.A. Vouk , Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
C. Alix , Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
P. Dixit , Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
pp. 213

DQS's experience with SRE (Abstract)

J.M. Gobat , Software Process & Reliability Eng., Albuquerque, NM, USA
W.W. Everett , Software Process & Reliability Eng., Albuquerque, NM, USA
pp. 219
B5: Distributed Computing: Session Chair: H. Leung

Software reliability engineering for client-server systems (Abstract)

N.F. Schneidewind , Naval Postgraduate Sch., Monterey, CA, USA
pp. 226

Policy-driven fault management in distributed systems (Abstract)

H.L. Lutfiyya , Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
M.A. Bauer , Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
A.D. Marshall , Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
M.J. Katchabaw , Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
pp. 236

A practical strategy for testing pair-wise coverage of network interfaces (Abstract)

R.L. Probert , Dept. of Comput. Sci., Ottawa Univ., Ont., Canada
A.W. Williams , Dept. of Comput. Sci., Ottawa Univ., Ont., Canada
pp. 246
C5: Fault Tolerance I: Session Chair: C. Kintala

Method for designing and placing check sets based on control flow analysis of programs (Abstract)

S.J. Geoghegan , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
D.R. Avresky , Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 256

A Replication Technique Based on a Functional and Attribute Grammar Computation Model (Abstract)

Masato Suzuki , Japan Adv. Inst. of Sci. & Technol., Nomi, Japan
Takuya Katayama , Japan Adv. Inst. of Sci. & Technol., Nomi, Japan
Adel Cherif , Japan Adv. Inst. of Sci. & Technol., Nomi, Japan
pp. 266

An on-line algorithm for checkpoint placement (Abstract)

A. Ziv , MATAM-Adv. Technol. Center, IBM Israel Sci. & Technol. Center, Haifa, Israel
J. Bruck , MATAM-Adv. Technol. Center, IBM Israel Sci. & Technol. Center, Haifa, Israel
pp. 274
B6: Reliability Growth Models: Session Chair: Y. Tohma

Efficient allocation of testing resources for software module testing based on the hyper-geometric distribution software reliability growth model (Abstract)

Sy-Yen Kuo , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Rong-Huei Hou , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Yi-Ping Chang , Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
pp. 289

Unification of finite failure non-homogeneous Poisson process models through test coverage (Abstract)

S.S. Gokhale , Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
T. Philip , Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
P.N. Marinos , Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
K.S. Trivedi , Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
pp. 299

A conservative theory for long term reliability growth prediction (Abstract)

R.E. Bloomfield , Adelard, London, UK
P.G. Bishop , Adelard, London, UK
pp. 308
C6: Fault Tolerance II: Session Chair: K. Trivedi

Primary-shadow consistency issues in the DRB scheme and the recovery time bound (Abstract)

K.H. Kim , Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
C. Subbaraman , Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
L. Bacellar , Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
pp. 319

An empirical evaluation of maximum likelihood voting in failure correlation conditions (Abstract)

M.A. Vouk , Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
K. Kim , Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
D.F. McAllister , Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
pp. 330

Supervision of real-time software systems using optimistic path prediction and rollbacks (Abstract)

R.E. Seviora , Bell Canada Software Reliability Lab., Waterloo Univ., Ont., Canada
D.A. Simser , Bell Canada Software Reliability Lab., Waterloo Univ., Ont., Canada
pp. 340
Plenary Session III Java/Web Reliability and Security Issues

Deploying SRE in Your Organization or Company (PDF)

J. Widmaier , BellCore Piscataway, NJ 08854
D. Rentschler , BellCore Piscataway, NJ 08854
J.A. Teresinski , BellCore Piscataway, NJ 08854
S. Steele , BellCore Piscataway, NJ 08854
A.A. Dolinsky , BellCore Piscataway, NJ 08854
pp. 352
B7: Modeling/Measurement: Session Chair: G. Knafl

Data partition based reliability modeling (Abstract)

J. Palma , Dept. of Comput. Sci. & Eng., Southern Methodist Univ., Dallas, TX, USA
J. Tian , Dept. of Comput. Sci. & Eng., Southern Methodist Univ., Dallas, TX, USA
pp. 354

Detection of software modules with high debug code churn in a very large legacy system (Abstract)

N. Goel , Florida Atlantic Univ., Boca Raton, FL, USA
J. McMullan , Florida Atlantic Univ., Boca Raton, FL, USA
E.B. Allen , Florida Atlantic Univ., Boca Raton, FL, USA
A. Nandi , Florida Atlantic Univ., Boca Raton, FL, USA
T.M. Khoshgoftaar , Florida Atlantic Univ., Boca Raton, FL, USA
pp. 364

Fault exposure ratio estimation and applications (Abstract)

Li Naixin , Microsoft Corp., Redmond, WA, USA
Y.K. Malaiya , Microsoft Corp., Redmond, WA, USA
pp. 372

Index of Authors (PDF)

pp. 383
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