The Community for Technology Leaders
Quality Electronic Design, International Symposium on (2008)
Mar. 17, 2008 to Mar. 19, 2008
ISBN: 978-0-7695-3117-5
TABLE OF CONTENTS

[Front cover] (PDF)

pp. c1

Conference at a glance (PDF)

pp. xxvii-xxviii
Papers

Cover Art (PDF)

pp. c1

Page i (PDF)

pp. i

Title Page iii (PDF)

pp. iii

Copyright Page (PDF)

pp. iv

Table of Contents (PDF)

pp. v-xviii

Welcome Notes (PDF)

pp. xix-xx

Conference at a Glance (PDF)

pp. xxvii-xxviii
Papers

Automated Standard Cell Library Analysis for Improved Defect Modeling (Abstract)

J.G. Brown , Carnegie Mellon Univ., Pittsburgh
R.D. Blanton , Carnegie Mellon Univ., Pittsburgh
pp. 643-648
Papers

A Root-Finding Method for Assessing SRAM Stability (Abstract)

R. Kanj , IBM Austin Res. Labs, Austin
Zhuo Li , IBM Austin Res. Labs, Austin
pp. 804-809
Papers

[Roster] (PDF)

pp. 888
Papers

Author Index (PDF)

pp. 877-883

Roster (PDF)

pp. 888
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