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2013 IEEE 43rd International Symposium on Multiple-Valued Logic (2000)
Portland, Oregon
May 23, 2000 to May 25, 2000
ISSN: 0195-623X
ISBN: 0-7695-0692-5
pp: 245
Yutaka Hata , Himeji Institute of Technology
Nobuyuki Matsui , Himeji Institute of Technology
Naotake Kamiura , Himeji Institute of Technology
ABSTRACT
In this paper, we propose controllability and observability measures to guide the D-algorithm for multiple-valued logic circuits. The former is determined in one forward traversal of the circuit, and used in determining the line where the consistency operation should proceed. The latter is determined in one backward traversal, and used in executing the D-drive at the fan out point. Our measures are computed by simple recursive formulas, and the time required for computing them is relatively short. The experimental results show that our measures are helpful in reducing the number of times for backtracking.
INDEX TERMS
multiple-valued logic, test generation, D-algorithm, controllability measure, observability measure
CITATION
Yutaka Hata, Nobuyuki Matsui, Naotake Kamiura, "Controllability/Observability Measures for Multiple-Valued Test Generation Based on D-Algorithm", 2013 IEEE 43rd International Symposium on Multiple-Valued Logic, vol. 00, no. , pp. 245, 2000, doi:10.1109/ISMVL.2000.848627
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