The Community for Technology Leaders
On-Line Testing Workshop, IEEE International (2000)
Palma de Mallorca, Spain
July 3, 2000 to July 5, 2000
ISBN: 0-7695-0646-1
TABLE OF CONTENTS
Keynote
Session 1: Fault Tolerance: Moderator: T.M. Mak, Intel

Micro-Checkpointing: Checkpointing for Multithreaded Applications (Abstract)

Z. Kalbarczyk , Univeristy of Illinois at Urbana-Champaign
R.K. Iyer , Univeristy of Illinois at Urbana-Champaign
K. Whisnant , Univeristy of Illinois at Urbana-Champaign
pp. 3

A COTS Wrapping Toolkit for Fault Tolerant Applications under Windows NT (Abstract)

Paolo Prinetto , Politecnico di Torino
Silvia Chiusano , Politecnico di Torino
Alfredo Benso , Politecnico di Torino
pp. 9

Evaluating the Effectiveness of a Software Fault-Tolerance Technique on RISC- and CISC-Based Architectures (Abstract)

B. Nicolescu , TIMA Laboratory
R. Velazco , TIMA Laboratory
P. Cheynet , TIMA Laboratory
M. Sonza Reorda , Politecnico di Torino
M. Violante , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
pp. 17
Session 2: Fault Tolerance and On-Line Testing for Reconfigurable Systems: Moderator: TBD

Relation between Fault Tolerance and Reconfiguration in Cellular Systems (Abstract)

Vladimir Drabek , Brno University of Technology
Lukas Sekanina , Brno University of Technology
pp. 25

Improving On-Line BIST-Based Diagnosis for Roving STARs (Abstract)

Brandon Skaggs , University of Kentucky
John Emmert , University of Kentucky
Charles Stroud , University of Kentucky
Miron Abramovici , Bell Labs - Lucent Technologies
pp. 31
Session 3: Reliability Issues in Nanometer Technologies and Radiation Effects

A Crosstalk Sensor Implementation for Measuring Interferences in Digital CMOS VLSI Circuits (Abstract)

M. Roca , University of Balearic Islands
R. Muñoz , University of the Basque Country
L.A. Aguado , University of the Basque Country
J.A. Maiz , University of the Basque Country
J.A. Sainz , University of the Basque Country
pp. 45

An Overview of the Applications of a Pulsed Laser System for SEU Testing (Abstract)

V. Pouget , Universit? Bordeaux 1
D. Lewis , Universit? Bordeaux 1
R. Ecoffet , CNES
S. Duzellier , ONERA-DESP
F.M. Roche , Universit? Montpellier II
L. Sarger , Universit? Bordeaux 1
H. Lapuyade , Universit? Bordeaux 1
P. Fouillat , Universit? Bordeaux 1
pp. 52
Session 4: Fault Injection:Regis Leveugle, TIMA Laboratory

New Techniques for Accelerating Fault Injection in VHDL Descriptions (Abstract)

M. Rebaudengo , Politecnico di Torino
B. Parrotta , Politecnico di Torino
M. Violante , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
pp. 61

Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL (Abstract)

Fabian Vargas , Catholic University - PUCRS
Alexandre Amory , Catholic University - PUCRS
Raoul Velazco , TIMA-INPG Laboratory
pp. 67

A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System (Abstract)

P.J. Gil , Universidad Polit?cnica de Valencia
D. Gil , Universidad Polit?cnica de Valencia
J.C. Baraza , Universidad Polit?cnica de Valencia
J. Gracia , Universidad Polit?cnica de Valencia
pp. 73
Session 5: On-Line Current Monitoring: Moderator: Andre Ivanov, U. of Brit. Columbia

On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor (Abstract)

J. Segura , University de les Illes Balears
B. Alorda , University de les Illes Balears
I. de Paul , University de les Illes Balears
T. Miller , University de les Illes Balears
pp. 87

I-V Fast IDDQ Current Sensor for On-Line Mixed-Signal/Analog Test (Abstract)

Martin Margala , University of Alberta
Srdjan Dragic , University of Alberta
Viera Stopjaková , Slovak University of Technology
Samuel Ekpe , University of Alberta
Ahmed El-Abasiry , University of Alberta
pp. 92

A Compact Built-In Current Sensor for IDDQ Testing (Abstract)

Th. Haniotakis , University of Patras
D. Nikolos , University of Patras
Y. Tsiatouhas , University of Patras and Integrated Systems Development S.A.
pp. 95

An Improved CMOS BICS for On-Line Testing (Abstract)

Y. Deval , Universit? Bordeaux 1
Y. Maidon , Universit? Bordeaux 1
J.B. Begueret , Universit? Bordeaux 1
pp. 100
Session 6: Concurrent Checking: Moderator: Bernd Straube, Fraunhofer IIS/EAS Dresden
Session 7: Built-In Self Testing: Moderator: Christian Dufaza, LIRMM

Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults (Abstract)

Christian Landrault , Universit? Montpellier II
Serge Pravossoudovitch , Universit? Montpellier II
Arnaud Virazel , Universit? Montpellier II
Patrick Girard , Universit? Montpellier II
pp. 121

On Using Deterministic Test Sets in BIST (Abstract)

Jiri Nosek , Technical University Liberec
Ondrej Novak , Technical University Liberec
pp. 127

Power Reduction in Test-Per-Scan BIST (Abstract)

Xiaodong Zhang , Synopsys Inc.
Kaushik Roy , Purdue University
pp. 133
Session 8: Self Checking Circuits and Analog Approaches: Moderator: Parag K. Lala, U. Arkansas

A New Method for Concurrent Checking by Use of a 1-out-of-4 Code (Abstract)

V. Saposhnikov , Railway Transportation State University
M. Gössel , University of Potsdam
Vl. Saposhnikov , Railway Transportation State University
A. Dmitiriev , University of Potsdam
pp. 147

Self-Checking FSM Design with Observing only FSM Outputs (Abstract)

S. Ostanin , Tomsk State University
A. Matrosova , Tomsk State University
pp. 153
Session 9: Coding Theory and Applications: Moderator: Stanislaw Piestrak, T.U. of Wroclaw

Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes (Abstract)

Markus Seuring , University of Potsdam
Nur A. Touba , University of Texas at Austin
Michael Gössel , University of Potsdam
Debaleena Das , University of Texas at Austin
pp. 171
Session 10: Fault Tolerance and On-Line Testing in Railway and Industrial Control

A Very Flexible DSP-Based Controller for On-Line Test and Control of Industrial Processes (Abstract)

M. Pasquariello , University of Naples ?Federico II?
A. Del Pizzo , University of Naples ?Federico II?
R. Rizzo , University of Naples ?Federico II?
M.E. Nillesen , Eindhoven University of Technology
pp. 179

On Realization of Fault-Tolerant Fuzzy Controllers (Abstract)

Naotake Kamiura , Himeji Institute of Technology
Nobuyuki Matsui , Himeji Institute of Technology
Teijiro Isokawa , Himeji Institute of Technology
Masashi Tomita , Himeji Institute of Technology
pp. 185

ISIS: A Fail-Safe Interface Realized in Smart Power Technology (Abstract)

T. Calin , TIMA Laboratory
M. Nicolaidis , TIMA Laboratory
N. Zaidan , TIMA Laboratory
pp. 191
Session 11: On-Line Testing and Self Repair

High-Level Synthesis Methodology for On-Line Testability Optimization (Abstract)

E. Simeu , Institut National Polytechnique de Grenoble
M.A. Naal , Institut National Polytechnique de Grenoble
pp. 201

Improving Fault Coverage in System Tests (Abstract)

Janusz Sosnowski , Warsaw University of Technology
pp. 207

A Family of Self-Repair SRAM Cores (Abstract)

Monica Lobetti Bodoni , Siemens Information and Communication Networks S.p.A.
P. Prinetto , Politecnico di Torino
S. Chiusano , Politecnico di Torino
A. Benso , Politecnico di Torino
G. Di Natale , Politecnico di Torino
pp. 214

Author Index (PDF)

pp. 219
254 ms
(Ver 3.1 (10032016))