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11th IEEE International On-Line Testing Symposium (2009)
Sesimbra-Lisbon, Portugal
June 24, 2009 to June 26, 2009
ISBN: 978-1-4244-4596-7
pp: 217-222
Alireza Ejlali , Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN
Yasser Sedaghat , Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN
Alireza Namazi , Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN
Seyed Ghassem Miremadi , Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN
ABSTRACT
This paper proposes a low-cost fault-tolerant Carry Look-Ahead (CLA) adder which consumes much less power and area overheads in comparison with other fault-tolerant CLA adders. Analytical and experimental results show that this adder corrects all single-bit and multiple-bit transient faults. The Power-Delay Product (PDP) and area overheads of this technique are decreased at least 82% and 71%, respectively, as compared to adders which use traditional TMR, parity prediction, and duplication techniques.
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CITATION
Alireza Ejlali, Yasser Sedaghat, Alireza Namazi, Seyed Ghassem Miremadi, "A low-cost fault-tolerant technique for Carry Look-Ahead adder", 11th IEEE International On-Line Testing Symposium, vol. 00, no. , pp. 217-222, 2009, doi:10.1109/IOLTS.2009.5196019
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