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Sesimbra, Lisbon
June 24, 2009 to June 26, 2009
ISBN: 978-1-4244-4596-7
pp: 189-191
Junfeng Fan , Katholieke Universiteit Leuven, ESAT/SCD-COSIC, Kasteelpark Arenberg 10, B-3001 Heverlee, Belgium
Miroslav Knezevic , Katholieke Universiteit Leuven, ESAT/SCD-COSIC, Kasteelpark Arenberg 10, B-3001 Heverlee, Belgium
Dusko Karaklajic , Katholieke Universiteit Leuven, ESAT/SCD-COSIC, Kasteelpark Arenberg 10, B-3001 Heverlee, Belgium
Roel Maes , Katholieke Universiteit Leuven, ESAT/SCD-COSIC, Kasteelpark Arenberg 10, B-3001 Heverlee, Belgium
Vladimir Rozic , Katholieke Universiteit Leuven, ESAT/SCD-COSIC, Kasteelpark Arenberg 10, B-3001 Heverlee, Belgium
Lejla Batina , Katholieke Universiteit Leuven, ESAT/SCD-COSIC, Kasteelpark Arenberg 10, B-3001 Heverlee, Belgium
Ingrid Verbauwhede , Katholieke Universiteit Leuven, ESAT/SCD-COSIC, Kasteelpark Arenberg 10, B-3001 Heverlee, Belgium
ABSTRACT
Testing of cryptographic chips or components has one extra dimension: physical security. The chip designers should improve the design if it leaks too much information through side-channels, such as timing, power consumption, electric-magnetic radiation, and so on. This requires an evaluation of the security level of the chip under different side-channel attacks before it is manufactured. This paper presents an FPGA-based testing strategy for cryptographic chips. Using a block-based architecture, a testing bus and a shadow FPGA, we are able to check information leakage of each block. We describe this strategy with an Elliptic Curve Cryptosystem (ECC) for RFID tags.
CITATION
Junfeng Fan, Miroslav Knezevic, Dusko Karaklajic, Roel Maes, Vladimir Rozic, Lejla Batina, Ingrid Verbauwhede, "FPGA-based testing strategy for cryptographic chips: A case study on Elliptic Curve Processor for RFID tags", IOLTS, 2009, 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) 2009, pp. 189-191, doi:10.1109/IOLTS.2009.5196009
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