11th IEEE International On-Line Testing Symposium (2009)
June 24, 2009 to June 26, 2009
Dan Alexandrescu , iRoC Technologies, France
Anne-Lise Lhomme-Perrot , iRoC Technologies, France
Erwin Schaefer , iRoC Technologies, France
Cyrille Beltrando , iRoC Technologies, France
The presentation concerns a practical approach for dealing with difficulties associated to real time testing in a natural environment of microelectronic devices.
E. Schaefer, C. Beltrando, A. Lhomme-Perrot and D. Alexandrescu, "Highs and lows of radiation testing," 11th IEEE International On-Line Testing Symposium(IOLTS), Sesimbra-Lisbon, Portugal, 2009, pp. 179.