11th IEEE International On-Line Testing Symposium (2009)
June 24, 2009 to June 26, 2009
Berk Sunar , Worcester Polytechnic Institute, CRIS Laboratory, 100 Institute Road, MA 01609, USA
Zhen Wang , Boston University, Reliable Computing Laboratory, 8 Saint Marys Street, MA, USA
Mark Karpovsky , Boston University, Reliable Computing Laboratory, 8 Saint Marys Street, MA, USA
We propose an efficient technique for the detection of errors in cryptographic circuits introduced by strong adversaries. Previously a number of linear and non-linear error detection schemes were proposed. Linear codes provide protection only against primitive adversaries which no longer represents practice. On the other hand non-linear codes provide protection against strong adversaries, but at the price of high overhead. Here we propose a novel error detection technique, based on the random selection of linear codes. Under mild assumptions the proposed construction achieves near non-linear code error detection performance at much lower cost due to the fact that no non-linear operations are needed for the encoder and decoder.
Berk Sunar, Zhen Wang, Mark Karpovsky, "Multilinear codes for robust error detection", 11th IEEE International On-Line Testing Symposium, vol. 00, no. , pp. 164-169, 2009, doi:10.1109/IOLTS.2009.5196002