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11th IEEE International On-Line Testing Symposium (2009)
Sesimbra-Lisbon, Portugal
June 24, 2009 to June 26, 2009
ISBN: 978-1-4244-4596-7
pp: 89-94
N. Battezzati , Politecnico di Torino, Italy
F. Decuzzi , Politecnico di Torino, Italy
M. Violante , Politecnico di Torino, Italy
M. Briet , Atmel Corp., France
Radiation-hardened-by-design (RHBD) SRAM-based FPGAs will play a crucial role in providing new generations of satellites with reliable in-flight reconfiguration ability, which is mandatory to enable the successful use of configurable computing in space. RHBD SRAM-based FPGAs sensitiveness against ionizing radiation is normally evaluated resorting to radiation testing, which provides the device cross-section. However, as a matter of fact, applications implemented on such devices use only a portion of the available resources, and the corresponding configuration memory. As a result, application-oriented sensitiveness analysis tools are needed that, by analyzing how the FPGA resources are actually used by a given application, produce application cross-section that is a reliability figure more accurate than device cross section. This paper presents a novel application-oriented sensitiveness analysis tool we are developing for the new generation of SRAM-based FPGAs from Atmel: the ATF280E.
N. Battezzati, F. Decuzzi, M. Violante, M. Briet, "Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs", 11th IEEE International On-Line Testing Symposium, vol. 00, no. , pp. 89-94, 2009, doi:10.1109/IOLTS.2009.5195988
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