11th IEEE International On-Line Testing Symposium (2009)
June 24, 2009 to June 26, 2009
P. Maistri , TIMA Laboratory (Grenoble INP, UJF, CNRS), 46 Avenue Félix Viallet - 38031 Cedex - France
R. Leveugle , TIMA Laboratory (Grenoble INP, UJF, CNRS), 46 Avenue Félix Viallet - 38031 Cedex - France
Embedded systems design is starting considering dependability issues even for mass-market systems. Soft error consequences must in particular be carefully analyzed. Usually, fault injection campaigns are run to analyze the consequences of transient faults, but the length of a comprehensive evaluation often collides with the severe requirements on design cycle times. We propose a new fault pruning technique to identify harmless components and computation cycles as soon as possible, thus avoiding useless fault injection experiments. The technique is based on a formal model of the system and we show that it can be used for both SEUs and SETs.
P. Maistri, R. Leveugle, "Towards automated fault pruning with Petri Nets", 11th IEEE International On-Line Testing Symposium, vol. 00, no. , pp. 41-46, 2009, doi:10.1109/IOLTS.2009.5195981