11th IEEE International On-Line Testing Symposium (2009)
June 24, 2009 to June 26, 2009
J.C. Vazquez , INESC-ID, R Alves Redol, 9, 1000-029 Lisboa, Portugal
V. Champac , Instituto Nacional de Astrofísica, Optica y Electrónica (INAOE), Mexico
A.M. Ziesemer , INESC-ID, R Alves Redol, 9, 1000-029 Lisboa, Portugal
R. Reis , Univ. Fed. Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
I.C. Teixeira , INESC-ID, R Alves Redol, 9, 1000-029 Lisboa, Portugal
M.B. Santos , INESC-ID, R Alves Redol, 9, 1000-029 Lisboa, Portugal
J.P. Teixeira , INESC-ID, R Alves Redol, 9, 1000-029 Lisboa, Portugal
Complex electronic systems for safety or mission-critical applications (automotive, space) must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while performance and quality requirements are increasing. One of the key reliability issues is to monitor long-term performance degradation due to aging in such harsh environments. For safe operation, or for preventive maintenance, it is desirable that such monitoring may be performed on chip. On-line built-in aging sensors (activated from time to time) can be an adequate solution for this problem. The purpose of this paper is to present a novel methodology for electronic systems aging monitoring, and to introduce a new architecture for an aging sensor. Aging monitoring is carried out by observing the degrading timing response of the digital system. The proposed solution takes into account power supply voltage and temperature variations and allows several levels of failure prediction. Simulation results are presented, that ascertain the usefulness of the proposed methodology.
M. Santos et al., "Built-in aging monitoring for safety-critical applications," 11th IEEE International On-Line Testing Symposium(IOLTS), Sesimbra-Lisbon, Portugal, 2009, pp. 9-14.