The Community for Technology Leaders
11th IEEE International On-Line Testing Symposium (2008)
July 7, 2008 to July 9, 2008
ISBN: 978-0-7695-3264-6
TABLE OF CONTENTS
Papers

Table of contents (PDF)

pp. v-ix

[Front cover] (PDF)

pp. C1

Title Page i (PDF)

pp. i

Title Page iii (PDF)

pp. iii

Modeling and Simulation of Circuit Aging in Scaled CMOS Design (Abstract)

Yu Kao , Arizona State Univ., Phoenix, AZ
pp. 197
Papers
Papers

Author Index (PDF)

pp. 303-305
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