11th IEEE International On-Line Testing Symposium (2007)
Heraklion, Crete, Greece
July 8, 2007 to July 11, 2007
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.14
L. Bolzani , Politecnico di Torino, Italy
E. Sanchez , Politecnico di Torino, Italy
M. Schillaci , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
G. Squillero , Politecnico di Torino, Italy
Test of peripheral modules has not yet been deeply investigated by the research community. When embedded in a system on a chip, peripheral cores introduce new issues for post-production testing. A peripheral core embedded in a SoC requires a test set able to properly perform two different tasks: configure the device in different operation modes and properly exercise it. In this paper an automatic approach able to generate test sets for peripheral cores embedded in a SoC is described. The presented approach is based on an evolutionary algorithm that exploits high-level simulation and gathers coverage metrics information to produce the test sets. The method compares favorably with results obtained by hand.
M. Schillaci, G. Squillero, E. Sanchez, L. Bolzani and M. S. Reorda, "An Automated Methodology for Cogeneration of Test Blocks for Peripheral Cores," 11th IEEE International On-Line Testing Symposium(IOLTS), Heraklion, Crete, Greece, 2007, pp. 265-270.