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11th IEEE International On-Line Testing Symposium (2003)
Kos Island, Greece
July 7, 2003 to July 9, 2003
ISBN: 0-7695-1968-7
pp: 163
D. Prestes , Catholic University - PUCRS
D. Brum , Catholic University - PUCRS
M. Reorda , Politecnico di Torino
F. Vargas , Catholic University - PUCRS
E. Rhod , Catholic University - PUCRS
L. Bolzani , Catholic University - PUCRS
INDEX TERMS
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CITATION
D. Prestes, D. Brum, M. Reorda, F. Vargas, E. Rhod, L. Bolzani, "Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: Are They A Good Remedy?", 11th IEEE International On-Line Testing Symposium, vol. 00, no. , pp. 163, 2003, doi:10.1109/OLT.2003.1214389
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