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2014 19th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) (2014)
Porto Alegre, Brazil
Sept. 17, 2014 to Sept. 19, 2014
ISBN: 978-1-4799-6540-3
TABLE OF CONTENTS

The influence of No Fault Found in analogue CMOS circuits (Abstract)

Jinbo Wan , Testable Design and Test of Integrated Systems (TDT) Group, University of Twente, Centre of Telematics and Information Technology (CTIT), Enschede, the Netherlands
Hans G. Kerkhoff , Testable Design and Test of Integrated Systems (TDT) Group, University of Twente, Centre of Telematics and Information Technology (CTIT), Enschede, the Netherlands
pp. 1-6

Low cost test architecture for mixed-signal integrated circuits (Abstract)

Julio L. da Silva , CEITEC S.A., Porto Alegre, Brazil
Emerson Camargo , CEITEC S.A., Porto Alegre, Brazil
Douglas Foster , CEITEC S.A., Porto Alegre, Brazil
Sandro T. Coelho , CEITEC S.A., Porto Alegre, Brazil
Antonio G. de Oliveira , CEITEC S.A., Porto Alegre, Brazil
Alfredo Olmos , CEITEC S.A., Porto Alegre, Brazil
Marcelo Lubaszewski , CEITEC S.A., Porto Alegre, Brazil
pp. 1-6

Low cost implicit built-in self-test of passive RFID Tags (Abstract)

Suvadeep Banerjee , School of Electrical and Computer Engineering, Georgia Institute of Technology, USA
Debashis Banerjee , School of Electrical and Computer Engineering, Georgia Institute of Technology, USA
Aritra Banerjee , School of Electrical and Computer Engineering, Georgia Institute of Technology, USA
Kyujeong Lee , Samsung Electronics, Korea
Abhijit Chatterjee , School of Electrical and Computer Engineering, Georgia Institute of Technology, USA
pp. 1-6

Real-time correction of dc servo motor and controller failures using analog checksums (Abstract)

Suvadeep Banerjee , School of Electrical and Computer Engineering, Georgia Institute of Technology, USA
Abhijit Chatterjee , School of Electrical and Computer Engineering, Georgia Institute of Technology, USA
Jacob A. Abraham , Electrical and Computer Engineering, University of Texas at Austin, USA
pp. 1-5

Phase noise measurement techniques using delta-sigma TDC (Abstract)

Yusuke Osawa , Division of Electronics and Informatics, Gunma University, Kiryu 376-8515 Japan
Daiki Hirabayashi , Division of Electronics and Informatics, Gunma University, Kiryu 376-8515 Japan
Naohiro Harigai , Division of Electronics and Informatics, Gunma University, Kiryu 376-8515 Japan
Haruo Kobayashi , Division of Electronics and Informatics, Gunma University, Kiryu 376-8515 Japan
Kiichi Niitsu , Nagoya University, Japan
Osamu Kobayashi , Semiconductor Technology Academic Research Center, Japan
pp. 1-6

Experimental verification of timing measurement circuit with self-calibration (Abstract)

Takeshi Chujo , Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu 376-8516 Japan
Daiki Hirabayashi , Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu 376-8516 Japan
Congbing Li , Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu 376-8516 Japan
Yutaro Kobayashi , Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu 376-8516 Japan
Junshan Wang , Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu 376-8516 Japan
Haruo Kobayashi , Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu 376-8516 Japan
Kentaroh Katoh , Tsuruoka National College of Technology, 997-8511 Japan
Sato Koshi , Hikari Science 366-0801 Japan
pp. 1-6

ATPG for mixed-signal circuits using commercial digital tools (Abstract)

Carsten Wegener , Corporate Engineering, Dialog Semiconductor GmbH, D-80222 Germering, Germany
pp. 1-6

Fault mitigation strategies for Single Event Transients on SAR converters (Abstract)

A. J. C. Lanot , Programa de Pós Graduação de Engenharia Elétrica, Departamento de Engenharia Elétrica, Universidade Federal do Rio Grande do Sul - Porto Alegre - Brazil
T. R. Balen , Programa de Pós Graduação de Engenharia Elétrica, Departamento de Engenharia Elétrica, Universidade Federal do Rio Grande do Sul - Porto Alegre - Brazil
pp. 1-6

An I2C based mixed-signal test and measurement infrastructure (Abstract)

Antonio Jose Salazar Escobar , INESC TEC; Faculdade de Engenharia da Universidade do Porto, Rua Dr. Roberto Frias, Campus da FEUP, 4200-465, Portugal
Jose Machado da Silva , INESC TEC; Faculdade de Engenharia da Universidade do Porto, Rua Dr. Roberto Frias, Campus da FEUP, 4200-465, Portugal
Miguel Correia , INESC TEC; Faculdade de Engenharia da Universidade do Porto, Rua Dr. Roberto Frias, Campus da FEUP, 4200-465, Portugal
pp. 1-6

Non-intrusive built-in test for 65nm RF LNA (Abstract)

Athanasios Dimakos , Université Grenoble Alpes, TIMA, F-38000, France
Haralampos-G. Stratigopoulos , Université Grenoble Alpes, TIMA, F-38000, France
Alexandre Siligaris , CEA-LETI, MINATEC Campus, 17 Rue des Martyrs, 38054 Grenoble, France
Salvador Mir , Université Grenoble Alpes, TIMA, F-38000, France
Emeric De Foucauld , CEA-LETI, MINATEC Campus, 17 Rue des Martyrs, 38054 Grenoble, France
pp. 1-6

Measuring the impact of voltage scaling for soft errors in SRAM-based FPGAs from a designer perspective (Abstract)

Jorge Tonfat , Instituto de Informática, PPGC, PGMICRO, UFRGS, Brazil
Jose Rodrigo Azambuja , Centro de Ciências Computacionais, FURG, Brazil
Gabriel Nazar , Instituto de Informática, PPGC, PGMICRO, UFRGS, Brazil
Paolo Rech , Instituto de Informática, PPGC, PGMICRO, UFRGS, Brazil
Fernanda Lima Kastensmidt , Instituto de Informática, PPGC, PGMICRO, UFRGS, Brazil
Luigi Carro , Instituto de Informática, PPGC, PGMICRO, UFRGS, Brazil
Ricardo Reis , Instituto de Informática, PPGC, PGMICRO, UFRGS, Brazil
Juliano Benfica , Departamento de Engenharia Elétrica, PUCRS, Brazil
Fabian Vargas , Departamento de Engenharia Elétrica, PUCRS, Brazil
Eduardo Bezerra , Departamento de Engenharia Elétrica, UFSC, Brazil
Christopher Frost , Rutherford Appleton Laboratory, ISIS, United Kingdom
pp. 1-6

An electro-chemical test and optimization system for impressed current cathodic corrosion protection (Abstract)

A. Andre Chang , School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
Jasbir N. Patel , School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
Haleh Shahbazbegian , School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
Bozena Kaminska , School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
pp. 1-5

Stochastic model for phase noise measurement from 1-bit signal acquisition (Abstract)

Stephane David-Grignot , LIRMM, CNRS/Univ. Montpellier 2, 161 rue Ada, 34392 Cedex, France
Florence Azais , LIRMM, CNRS/Univ. Montpellier 2, 161 rue Ada, 34392 Cedex, France
Laurent Latorre , LIRMM, CNRS/Univ. Montpellier 2, 161 rue Ada, 34392 Cedex, France
Francois Lefevre , NXP Semiconductors - Caen, 2 Esplanade Anton Phillips, 14000, France
pp. 1-6

Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module (Abstract)

M. Dieng , LIRMM - CNRS / Univ. Montpellier 2, 161 rue Ada, 34392, France
F. Azais , LIRMM - CNRS / Univ. Montpellier 2, 161 rue Ada, 34392, France
M. Comte , LIRMM - CNRS / Univ. Montpellier 2, 161 rue Ada, 34392, France
S. Bernard , LIRMM - CNRS / Univ. Montpellier 2, 161 rue Ada, 34392, France
V. Kerzerho , LIRMM - CNRS / Univ. Montpellier 2, 161 rue Ada, 34392, France
M. Renovell , LIRMM - CNRS / Univ. Montpellier 2, 161 rue Ada, 34392, France
T. Kervaon , NXP Semiconductors Caen, Campus Efficience, 14460 Colombelles, France
P.H. Pugliesi-Conti , NXP Semiconductors Caen, Campus Efficience, 14460 Colombelles, France
pp. 1-6

Alternate Biasing Modular Redundancy: An alternative tolerance technique to cope with TID effects (Abstract)

Tiago R. Balen , Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Rafael G. Vaz , Instituto de Estudos Avançados (IEAv), Departamento de Ciência de Tecnologia Aeroespacial (DCTA), São José dos Campos, SP, Brazil
Gustavo S. Fernandes , Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Ederson R. Machado , Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
Odair L. Goncalez , Instituto de Estudos Avançados (IEAv), Departamento de Ciência de Tecnologia Aeroespacial (DCTA), São José dos Campos, SP, Brazil
pp. 1-5

Integrated cross-layer solutions for enabling silicon photonics into future chip multiprocessors (Abstract)

Paolo Grani , Department of Information Engineering and Mathematical Sciences, University of Siena, via Roma 56, 53100, Italy
Sandro Bartolini , Department of Information Engineering and Mathematical Sciences, University of Siena, via Roma 56, 53100, Italy
Emanuele Furdiani , Engineering Department, University of Ferrara, Via Saragat 1, 44122, Italy
Luca Ramini , Engineering Department, University of Ferrara, Via Saragat 1, 44122, Italy
Davide Bertozzi , Engineering Department, University of Ferrara, Via Saragat 1, 44122, Italy
pp. 1-8
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