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2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) (2016)
Chicago, IL, USA
April 11, 2016 to April 15, 2016
ISBN: 978-1-5090-3675-2
pp: 35-38
ABSTRACT
Combinatorial testing has been widely utilized in testing softwares, e.g. Siemens Suite. This paper aims to investigate the reason why combinatorial testing works in Siemens Suite. Experiments are designed to get the MFS(minimal failure-causing schema) for Siemens Suite, which has been used as a benchmark to evaluate the effectiveness of many testing techniques. The lowerbound of fault-detecting probability of 1C;-way combinatorial test suite for each program is calculated by analyzing the strengths and the number of MFS for each faulty version. Computational results could explain the effectiveness of combinatorial testing in Siemens Suite.
INDEX TERMS
Input variables, Conferences, Software testing, Software, Computational modeling, Benchmark testing
CITATION

C. Xu, Y. Qi, Z. Wang and W. Zhang, "Analyzing Minimal Failure-Causing Schemas in Siemens Suite," 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), Chicago, IL, USA, 2016, pp. 35-38.
doi:10.1109/ICSTW.2016.33
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