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2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) (2015)
Graz, Austria
April 13, 2015 to April 17, 2015
ISBN: 978-1-4799-1885-0
pp: 1-8
Lionel Riviere , SAFRAN Morpho, France
Julien Bringer , SAFRAN Morpho, France
Thanh-Ha Le , SAFRAN Morpho, France
Herve Chabanne , SAFRAN Morpho, France
ABSTRACT
Physical perturbations are performed against embedded systems that can contain valuable data. Such devices and in particular smart cards are targeted because potential attackers hold them. The embedded system security must hold against intentional hardware failures that can result in software errors. In a malicious purpose, an attacker could exploit such errors to find out secret data or disrupt a transaction. Simulation techniques help to point out fault injection vulnerabilities and come at an early stage in the development process. This paper proposes a generic fault injection simulation tool that has the particularity to embed the injection mechanism into the smart card source code. By its embedded nature, the Embedded Fault Simulator (EFS) allows us to perform fault injection simulations and side-channel analyses simultaneously. It makes it possible to achieve combined attacks, multiple fault attacks and to perform backward analyses. We appraise our approach on real, modern and complex smart card systems under data and control flow fault models. We illustrate the EFS capacities by performing a practical combined attack on an Advanced Encryption Standard (AES) implementation.
INDEX TERMS
Smart cards, Security, Hardware, Software, Registers, Data models, Object oriented modeling
CITATION

L. Riviere, J. Bringer, T. Le and H. Chabanne, "A novel simulation approach for fault injection resistance evaluation on smart cards," 2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), Graz, Austria, 2015, pp. 1-8.
doi:10.1109/ICSTW.2015.7107460
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