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Software Testing Verification and Validation Workshop, IEEE International Conference on (2010)
Paris, France
Apr. 6, 2010 to Apr. 10, 2010
ISBN: 978-0-7695-4050-4
pp: 80-89
ABSTRACT
We argue that higher order mutants are potentially better able to simulate real faults and to reveal insights into bugs than the restricted class of first order mutants. The Mutation Testing community has previously shied away from Higher Order Mutation Testing believing it to be too expensive and therefore impractical. However, this paper argues that Search Based Software Engineering can provide a solution to this apparent problem, citing results from recent work on search based optimization techniques for constructing higher order mutants. We also present a research agenda for the development of Higher Order Mutation Testing.
INDEX TERMS
Higher Order Mutation Testing
CITATION

W. B. Langdon, M. Harman and Y. Jia, "A Manifesto for Higher Order Mutation Testing," Software Testing Verification and Validation Workshop, IEEE International Conference on(ICSTW), Paris, France, 2010, pp. 80-89.
doi:10.1109/ICSTW.2010.13
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