2014 IEEE Seventh International Conference on Software Testing, Verification and Validation (ICST) (2014)
Cleveland, OH, USA
March 31, 2014 to April 4, 2014
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICST.2014.37
regression testing, random testing, test case minimization
A. Groce, M. A. Alipour, C. Zhang, Y. Chen and J. Regehr, "Cause Reduction for Quick Testing," 2014 IEEE Seventh International Conference on Software Testing, Verification and Validation (ICST), Cleveland, OH, USA, 2014, pp. 243-252.