The Community for Technology Leaders
2010 20th International Conference on Pattern Recognition (ICPR 2010) (2010)
Istanbul
Aug. 23, 2010 to Aug. 26, 2010
ISSN: 1051-4651
ISBN: 978-1-4244-7542-1
TABLE OF CONTENTS

Local Outlier Detection Based on Kernel Regression (Abstract)

Jun Gao , Nat. Lab. of Pattern Recognition, CAS, Beijing, China
Weiming Hu , Nat. Lab. of Pattern Recognition, CAS, Beijing, China
Wei Li , Nat. Lab. of Pattern Recognition, CAS, Beijing, China
Zhongfei Zhang , Dept. of Comput. Sci., State Univ. of New York at Binghamton, Binghamton, NY, USA
Ou Wu , Nat. Lab. of Pattern Recognition, CAS, Beijing, China
pp. 585-588

Probabilistic Clustering Using the Baum-Eagon Inequality (Abstract)

Samuel Rota Bulo , DSI, Univ. of Venice, Venice, Italy
Marcello Pelillo , DSI, Univ. of Venice, Venice, Italy
pp. 1429-1432
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