Pattern Recognition, International Conference on (2004)
Aug. 23, 2004 to Aug. 26, 2004
W. A. P. Smith , The University of York, UK
A. Robles-Kelly , The University of York, UK
E. R. Hancock , The University of York, UK
We present a parameter-free method for estimating the BRDF of a subject's skin from a single image. We show how the technique can be used for photometric correction as a preprocessing step for face analysis tasks, and show its application to graphics by re-rendering faces with different skin reflectance models.
W. A. Smith, A. Robles-Kelly and E. R. Hancock, "Skin Reflectance Modelling for Face Recognition," Pattern Recognition, International Conference on(ICPR), Cambridge UK, 2004, pp. 210-213.