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2017 46th International Conference on Parallel Processing (ICPP) (2017)
Bristol, United Kingdom
Aug. 14, 2017 to Aug. 17, 2017
ISSN: 2332-5690
ISBN: 978-1-5386-1042-8
pp: 581-590
Projections and measurements of error rates in near-exascale and exascale systems suggest a dramatic growth, due to extreme scale (10^9 cores), concurrency, software complexity, and deep submicron transistor scaling. Such a growth makes resilience a critical concern, and may increase the incidence of errors that "escape", silently corrupting application state. Such errors can often be revealed by application software tests but with long latencies, and thus are known as latent errors. We explore how to efficiently recover from latent errors, with an approach called application-based focused recovery (ABFR). Specifically we present a case study of stencil computations, a widely useful computational structure, showing how ABFR focuses recovery effort where needed, using intelligent testing and pruning to reduce recovery effort, and enables recovery effort to be overlapped with application computation. We analyze and characterize the ABFR approach on stencils, creating a performance model parameterized by error rate and detection interval (latency). We compare projections from the model to experimental results with the Chombo stencil application, validating the model and showing that ABFR on stencil can achieve a significant reductions in error recovery cost (up to 400x) and recovery latency (up to 4x). Such reductions enable efficient execution at scale with high latent error rates.
Computational modeling, Error analysis, Detectors, Arrays, Resilience, Kernel,Resilience, Latent Error, Stencil, Application-based Fault Tolerance
Aiman Fang, Aurelien Cavelan, Yves Robert, Andrew A. Chien, "Resilience for Stencil Computations with Latent Errors", 2017 46th International Conference on Parallel Processing (ICPP), vol. 00, no. , pp. 581-590, 2017, doi:10.1109/ICPP.2017.67
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