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2015 IEEE 31st International Conference on Data Engineering (ICDE) (2015)
Seoul, South Korea
April 13, 2015 to April 17, 2015
ISBN: 978-1-4799-7964-6
pp: 1400-1403
Shane Bracher , Strategic Customer Engagement, SAP Labs, Brisbane, Australia
Mark Holmes , Strategic Customer Engagement, SAP Labs, Brisbane, Australia
Liam Mischewski , Strategic Customer Engagement, SAP Labs, Brisbane, Australia
Asadul Islam , Strategic Customer Engagement, SAP Labs, Brisbane, Australia
Michael McClenaghan , Strategic Customer Engagement, SAP Labs, Brisbane, Australia
Daniel Ricketts , Strategic Customer Engagement, SAP Labs, Brisbane, Australia
Glenn Neuber , Strategic Customer Engagement, SAP Labs, Brisbane, Australia
Hoyoung Jeung , Strategic Customer Engagement, SAP Labs, Brisbane, Australia
Priya Vijayarajendran , Strategic Customer Engagement, SAP Labs, Brisbane, Australia
ABSTRACT
We present a demonstration based on SAP HANA to show a novel approach to churn risk scoring. Our focus is customer retention within a telecommunications setting. The purpose of this demonstration is to help identify customers who should be targeted for a customer retention marketing campaign. The data analysis considers multiple factors - churn likelihood (based on incoming and outgoing communications), customer influence (based on social connections) and the average revenue per customer. The results are presented using skyline visualization and advanced UI techniques to easily and intuitively interpret the analysis.
INDEX TERMS
Data models, Electric breakdown, Telecommunications, Data analysis, Social network services, Analytical models, Companies
CITATION
Shane Bracher, Mark Holmes, Liam Mischewski, Asadul Islam, Michael McClenaghan, Daniel Ricketts, Glenn Neuber, Hoyoung Jeung, Priya Vijayarajendran, "Advanced analytics on SAP HANA: Churn risk scoring using call network analysis", 2015 IEEE 31st International Conference on Data Engineering (ICDE), vol. 00, no. , pp. 1400-1403, 2015, doi:10.1109/ICDE.2015.7113386
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