2010 IEEE 26th International Conference on Data Engineering (ICDE 2010) (2010)

Long Beach, CA, USA

Mar. 1, 2010 to Mar. 6, 2010

ISBN: 978-1-4244-5445-7

pp: 796-807

Reynold Cheng , Department of Computer Science, The University of Hong Kong, Pokfulam Road, Hong Kong

Xike Xie , Department of Computer Science, The University of Hong Kong, Pokfulam Road, Hong Kong

Man Lung Yiu , Department of Computing, Hong Kong Polytechnic University, Hung Hom, Hong Kong

Jinchuan Chen , Key Lab for Data Engineering and Knowledge Engineering, MOE. Renmin University of China, China

Liwen Sun , Department of Computer Science, The University of Hong Kong, Pokfulam Road, Hong Kong

ABSTRACT

The Voronoi diagram is an important technique for answering nearest-neighbor queries for spatial databases. In this paper, we study how the Voronoi diagram can be used on uncertain data, which are inherent in scientific and business applications. In particular, we propose the Uncertain-Voronoi Diagram (or UV-diagram in short). Conceptually, the data space is divided into distinct “UV-partitions”, where each UV-partition P is associated with a set S of objects; any point q located in P has the set S as its nearest neighbor with non-zero probabilities. The UV-diagram facilitates queries that inquire objects for having non-zero chances of being the nearest neighbor of a given query point. It also allows analysis of nearest neighbor information, e.g., finding out how many objects are the nearest neighbors in a given area. However, a UV-diagram requires exponential construction and storage costs. To tackle these problems, we devise an alternative representation for UV-partitions, and develop an adaptive index for the UV-diagram. This index can be constructed in polynomial time. We examine how it can be extended to support other related queries. We also perform extensive experiments to validate the effectiveness of our approach.

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CITATION

R. Cheng, J. Chen, X. Xie, M. L. Yiu and L. Sun, "UV-diagram: A Voronoi diagram for uncertain data,"

*2010 IEEE 26th International Conference on Data Engineering (ICDE 2010)(ICDE)*, Long Beach, CA, USA, 2010, pp. 796-807.

doi:10.1109/ICDE.2010.5447917

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