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2008 IEEE 24th International Conference on Data Engineering (2008)
Cancun, Mexico
Apr. 7, 2008 to Apr. 12, 2008
ISBN: 978-1-4244-1836-7
pp: 1480-1482
Nodira Khoussainova , Computer Science&Engineering Department, University of Washington, Seattle, Washington, USA. nodira@cs.washington.edu
Magdalena Balazinska , Computer Science&Engineering Department, University of Washington, Seattle, Washington, USA. magda@cs.washington.edu
Dan Suciu , Computer Science&Engineering Department, University of Washington, Seattle, Washington, USA. suciu@cs.washington.edu
ABSTRACT
We present PEEX, a system that enables applications to define and extract meaningful probabilistic high-level events from RFID data. PEEX effectively copes with errors in the data and the inherent ambiguity of event extraction.
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CITATION

D. Suciu, M. Balazinska and N. Khoussainova, "Probabilistic Event Extraction from RFID Data," 2008 IEEE 24th International Conference on Data Engineering(ICDE), Cancun, Mexico, 2008, pp. 1480-1482.
doi:10.1109/ICDE.2008.4497596
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