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2013 IEEE 29th International Conference on Data Engineering (ICDE) (2000)
San Diego, California
Feb. 28, 2000 to Mar. 3, 2000
ISSN: 1063-6382
ISBN: 0-7695-0506-6
pp: 677
Dimitrios Georgakopoulos , Microelectronics and Computer Technology Corporation
Andrzej Cichocki , Microelectronics and Computer Technology Corporation
Marek Rusinkiewicz , Microelectronics and Computer Technology Corporation
Hans Schuster , Microelectronics and Computer Technology Corporation
Donald Baker , Microelectronics and Computer Technology Corporation
ABSTRACT
The Collaboration Management Infrastructure (CMI) project at MCC is developing comprehensive process- and service-oriented solutions to promote, support, and manage collaboration. CMI research solutions address key requirements of applications that cannot be fully supported by existing workflow and groupware technology. In this demonstration we show how a crisis mitigation application can be supported by CMI technology.A crisis is a situation that occurs unexpectedly and its exact course is unknown and unpredictable. While responding to an unfolding crisis may involve unpredictability and improvisation, organizations that respond to a large number of similar crises have developed crisis mitigation processes that provide enough structure to prevent chaotic response and increase mitigation effectiveness. However, such mitigation processes must also allow coordination flexibility and dynamic change that empower process participants to make and carry out decisions that deal with the current situation. To accomplish this, CMI provides novel process model capabilities, such as process templates, repeated optional dependencies, and customized awareness provisioning.
INDEX TERMS
Collaboration, Process Templates, Dynamic Process Change, Workflow Management, Crisis Mitigation
CITATION
Dimitrios Georgakopoulos, Andrzej Cichocki, Marek Rusinkiewicz, Hans Schuster, Donald Baker, "The Collaboration Management Infrastructure", 2013 IEEE 29th International Conference on Data Engineering (ICDE), vol. 00, no. , pp. 677, 2000, doi:10.1109/ICDE.2000.839490
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