Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors (1995)
Oct. 2, 1995 to Oct. 4, 1995
M.S. Hsiao , Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
J.H. Patel , Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
A new technique is proposed to handle fault simulation at the architectural level. The technique bypasses the need for complete gate level structure and efficiently uses the architectural information. Symbolic data representing groups of stuck at faults, known as fault effects, are propagated across the circuit with intelligent propagation prediction. Fault effects may combine and form new groups in the process. Automated behavioral simulation using only three data types is used to propagate fault effects at the architectural level by propagation prediction; no additional high level constraints or precomputation of faulty behavior are needed for simulation. Although not a fully deterministic algorithm, the results of ALFSIM, Architectural Level Fault Simulation, show high accuracy when compared with the gate level fault simulation.
circuit analysis computing; integrated circuit design; fault diagnosis; VLSI; architectural-level fault simulation; propagation prediction; grouped fault-effects; architectural level; symbolic data; stuck at faults; fault effects; intelligent propagation prediction; automated behavioral simulation; data types; deterministic algorithm; ALFSIM; Architectural Level Fault Simulation; gate level fault simulation
J. Patel and M. Hsiao, "A new architectural-level fault simulation using propagation prediction of grouped fault-effects," Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors(ICCD), Austin, Texas, 1995, pp. 628.