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2011 IEEE 13th International Symposium on High-Assurance Systems Engineering (2011)
Boca Raton, Florida USA
Nov. 10, 2011 to Nov. 12, 2011
ISSN: 1530-2059
ISBN: 978-0-7695-4615-5
pp: 333-339
ABSTRACT
Electrostatic discharge (ESD) is often the cause of system-level failure or malfunction of embedded systems. The underlying faults are difficult to localize, as the information gained from the hardware-based diagnostic methods typically in use lacks sufficient detail. The alternative proposed in this paper is software instrumentation that monitors key registers and flags to detect anomalies indicative of failure. In contrast to hardware-based techniques, which use invasive probes that can alter the very phenomena being studied, the proposed approach makes use of standard peripherals such as the serial or Ethernet port to monitor and record the effect of ESD. We illustrate the use of this software instrumentation technique in conjunction with a three-dimensional ESD injection system to produce a sensitivity map that visualizes the susceptibility of various segments of an embedded system to ESD.
INDEX TERMS
software instrumentation, embedded systems, electrostatic discharge, electromagnetic interference, fault localization
CITATION

S. Sedigh, B. Seol, P. Maheshwari, J. Lee, J. Lim and D. Pommerenke, "Software-Based Instrumentation for Localization of Faults Caused by Electrostatic Discharge," 2011 IEEE 13th International Symposium on High-Assurance Systems Engineering(HASE), Boca Raton, Florida USA, 2011, pp. 333-339.
doi:10.1109/HASE.2011.64
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