2013 IEEE 54th Annual Symposium on Foundations of Computer Science (1969)
Oct. 15, 1969 to Oct. 17, 1969
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/SWAT.1969.6
Some new techniques for finding minimal set of tests which detect faults in combinational logic networks are described. A systematic procedure which can be programmed on a digital computer is given. Moreover, a new approach to the design of fault detection experiments for sequential machines which takes into account the actual construction of the sequential network is described.
Igal Kohavi, "Fault diagnosis of logical circuits", 2013 IEEE 54th Annual Symposium on Foundations of Computer Science, vol. 00, no. , pp. 166-173, 1969, doi:10.1109/SWAT.1969.6