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European Test Symposium (ETS'05) (2005)
Tallinn, Estonia
May 22, 2005 to May 25, 2005
ISBN: 0-7695-2341-2
TABLE OF CONTENTS

Energy minimization for hybrid BIST in a system-on-chip test environment (Abstract)

R. Ubar , Dept. of Comput. Eng., Tallinn Univ. of Technol., Estonia
T. Shchenova , Dept. of Comput. Eng., Tallinn Univ. of Technol., Estonia
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