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2012 17th IEEE European Test Symposium (ETS) (2012)
Annecy France
May 28, 2012 to May 31, 2012
ISBN: 978-1-4673-0696-6

Power-aware testing: The next stage (Abstract)

Xiaoqing Wen , Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan
pp. 1

Indirect method for random jitter measurement on SoCs using critical path characterization (Abstract)

Jae Wook Lee , Intel Corp., Austin, TX, USA
Ji Hwan Chun , Intel Corp., Santa Clara, CA, USA
J. A. Abraham , Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
pp. 1-6
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