2013 18th IEEE European Test Symposium (ETS) (2011)
May 23, 2011 to May 27, 2011
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ETS.2011.45
For accurate failure prediction, it is important to eliminate the environmental delay variations from the measure delays for capturing the actual delay shift caused by aging. This paper presents a novel test pattern optimization method to reduces spatial and temporal temperature variations during delay test.
H. Fujiwara, Y. Sato, M. Nakao, M. Inoue and T. Yoneda, "Temperature-Variation-Aware Test Pattern Optimization," 2011 16th IEEE European Test Symposium (ETS), Trondheim, 2011, pp. 214.