2013 18th IEEE European Test Symposium (ETS) (2011)
May 23, 2011 to May 27, 2011
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ETS.2011.45
For accurate failure prediction, it is important to eliminate the environmental delay variations from the measure delays for capturing the actual delay shift caused by aging. This paper presents a novel test pattern optimization method to reduces spatial and temporal temperature variations during delay test.
Hideo Fujiwara, Yasuo Sato, Makoto Nakao, Michiko Inoue, Tomokazu Yoneda, "Temperature-Variation-Aware Test Pattern Optimization", 2013 18th IEEE European Test Symposium (ETS), vol. 00, no. , pp. 214, 2011, doi:10.1109/ETS.2011.45