The Community for Technology Leaders
2013 18th IEEE European Test Symposium (ETS) (2011)
Trondheim, Norway
May 23, 2011 to May 27, 2011
ISSN: 1530-1877
ISBN: 978-0-7695-4433-5
pp: 214
For accurate failure prediction, it is important to eliminate the environmental delay variations from the measure delays for capturing the actual delay shift caused by aging. This paper presents a novel test pattern optimization method to reduces spatial and temporal temperature variations during delay test.

H. Fujiwara, Y. Sato, M. Nakao, M. Inoue and T. Yoneda, "Temperature-Variation-Aware Test Pattern Optimization," 2011 16th IEEE European Test Symposium (ETS), Trondheim, 2011, pp. 214.
89 ms
(Ver 3.3 (11022016))