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2013 18th IEEE European Test Symposium (ETS) (2011)
Trondheim, Norway
May 23, 2011 to May 27, 2011
ISSN: 1530-1877
ISBN: 978-0-7695-4433-5
pp: 214
ABSTRACT
For accurate failure prediction, it is important to eliminate the environmental delay variations from the measure delays for capturing the actual delay shift caused by aging. This paper presents a novel test pattern optimization method to reduces spatial and temporal temperature variations during delay test.
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CITATION
Hideo Fujiwara, Yasuo Sato, Makoto Nakao, Michiko Inoue, Tomokazu Yoneda, "Temperature-Variation-Aware Test Pattern Optimization", 2013 18th IEEE European Test Symposium (ETS), vol. 00, no. , pp. 214, 2011, doi:10.1109/ETS.2011.45
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