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2013 18th IEEE European Test Symposium (ETS) (2011)
Trondheim, Norway
May 23, 2011 to May 27, 2011
ISSN: 1530-1877
ISBN: 978-0-7695-4433-5
pp: 214
For accurate failure prediction, it is important to eliminate the environmental delay variations from the measure delays for capturing the actual delay shift caused by aging. This paper presents a novel test pattern optimization method to reduces spatial and temporal temperature variations during delay test.
Hideo Fujiwara, Yasuo Sato, Makoto Nakao, Michiko Inoue, Tomokazu Yoneda, "Temperature-Variation-Aware Test Pattern Optimization", 2013 18th IEEE European Test Symposium (ETS), vol. 00, no. , pp. 214, 2011, doi:10.1109/ETS.2011.45
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