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2013 18th IEEE European Test Symposium (ETS) (2011)
Trondheim, Norway
May 23, 2011 to May 27, 2011
ISSN: 1530-1877
ISBN: 978-0-7695-4433-5
pp: 207
We propose a low hardware overhead mechanism for internal FPGA configuration check and repair. The approach is effective against soft errors in the configuration memory (i.e., the errors caused by high energy radiation also known as Single Event Upsets). The proposed recovery mechanism occupies less hardware resources and has the shortest fault recovery time than the solutions reported so far.

F. Novak, U. Legat and A. Biasizzo, "FPGA Soft Error Recovery Mechanism with Small Hardware Overhead," 2011 16th IEEE European Test Symposium (ETS), Trondheim, 2011, pp. 207.
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