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2013 18th IEEE European Test Symposium (ETS) (2011)
Trondheim, Norway
May 23, 2011 to May 27, 2011
ISSN: 1530-1877
ISBN: 978-0-7695-4433-5
pp: 183-188
ABSTRACT
Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is increased at the cost of reduced performability. In this paper, a new diagnosis method based on the standard flow of industrial volume testing is presented, which is able to identify the intact functions rather than providing only a pass/fail result for the complete switch. The new method combines for the first time the precision of structural testing with information on the functional behavior in the presence of defects to determine the unaffected switch functions and use partially defective NoC switches. According to the experimental results, this improves the performability of NoCs as more than 61\% of defects only impair one switch port. Unlike previous methods for implementing fault tolerant switches, the developed technique does not impose any additional area overhead and is compatible with any switch design.
INDEX TERMS
Network-on-Chip, Graceful Degradation, Performability, Logic Diagnosis
CITATION
Stefan Holst, Melanie Elm, Atefe Dalirsani, Hans-Joachim Wunderlich, "Structural Test for Graceful Degradation of NoC Switches", 2013 18th IEEE European Test Symposium (ETS), vol. 00, no. , pp. 183-188, 2011, doi:10.1109/ETS.2011.33
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