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2013 18th IEEE European Test Symposium (ETS) (2011)
Trondheim, Norway
May 23, 2011 to May 27, 2011
ISSN: 1530-1877
ISBN: 978-0-7695-4433-5
pp: 147-152
ABSTRACT
The paper proposes a new hierarchical untestable stuck-at fault identification method for non-scan sequential circuits containing feedback loops. The method is based on deriving, minimizing and solving test path activation constraints for modules embedded into Register-Transfer Level (RTL) designs. First, an RTL test pattern generator is applied in order to extract the set of all possible test path activation constraints for a module under test. Then, the constraints are minimized and a constraint-driven deterministic test pattern generator is run providing hierarchical test generation and untestability proof in sequential circuits. We show by experiments that the tool is capable of quickly proving a large number of untestable faults obtaining high fault efficiency. As a side effect, our study shows that traditional bottom-up test generation based on symbolic test environment generation at RTL is too optimistic due to the fact that propagation constraints are ignored.
INDEX TERMS
CITATION
Anna Rannaste, Taavi Viilukas, Maksim Jenihhin, Hideo Fujiwara, Jaan Raik, Raimund Ubar, "Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits", 2013 18th IEEE European Test Symposium (ETS), vol. 00, no. , pp. 147-152, 2011, doi:10.1109/ETS.2011.38
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