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2013 18th IEEE European Test Symposium (ETS) (2011)
Trondheim, Norway
May 23, 2011 to May 27, 2011
ISSN: 1530-1877
ISBN: 978-0-7695-4433-5
pp: 141-146
ABSTRACT
The correlation between the physical paths of a digital circuit has important implications in various design automation problems, such as timing analysis, test generation and diagnosis. When considering the complexity and tight timing constraints of modern circuits, this correlation affects both the design process and the testing approaches followed in manufacturing. In this work we quantify the diversity of a set of paths (or path segments), let these be critical I/O paths, error propagation paths for various fault models, or paths traced for diagnostic purposes. Circuit paths are encoded using Zero-Suppressed Binary Decision Diagrams (ZBDDs), the proposed method consists of a sequence of standard ZBDD operations to provide a measure of the overlap of the paths under consideration. The main contribution of the presented method is that, path or path segment enumeration is entirely avoided and, hence, a large number of paths can be considered in practical time. Experimentation using standard benchmark circuits demonstrates the effectiveness of the approach in showing the difference in path correlation between various critical I/O path sets.
INDEX TERMS
path similarity, zero-supressed binary decision diagrams, digital circuits
CITATION
Kyriakos Christou, Stelios Neophytou, Maria K. Michael, "An Approach for Quantifying Path Correlation in Digital Circuits without any Path or Segment Enumeration", 2013 18th IEEE European Test Symposium (ETS), vol. 00, no. , pp. 141-146, 2011, doi:10.1109/ETS.2011.44
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