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2011 16th IEEE European Test Symposium (ETS) (2011)
Trondheim
May 23, 2011 to May 27, 2011
ISSN: 1530-1877
ISBN: 978-1-4577-0483-3
pp: 211
ABSTRACT
We propose using logic implications as a source of online diagnostic data for on-chip test set selection by taking advantage of their ability to automatically identify a restricted set of faults as the potential cause of an observed error. This information will be used to dynamically choose a test set to detect systematic latent defects or wear out in a multi core system.
INDEX TERMS
dynamic testing, error detection, integrated circuit testing, system-on-chip
CITATION

N. Alves, Y. Shi, N. Imbriglia, J. Dworak, K. Nepal and R. Bahar, "Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis," 2011 16th IEEE European Test Symposium (ETS), Trondheim, 2011, pp. 211.
doi:10.1109/ETS.2011.59
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