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2011 16th IEEE European Test Symposium (ETS) (2011)
Trondheim
May 23, 2011 to May 27, 2011
ISSN: 1530-1877
ISBN: 978-1-4577-0483-3
pp: 177-182
ABSTRACT
Testing for small-delay defects (SDDs) becomes necessary as technology further scales. Traditional timing-unaware transition-delay fault (TDF) ATPGs are not adequate for detecting SDDs due to sensitization of short paths. Timing-aware ATPGs suffer from multiple paths sensitization limitation and significant test cost. In this paper, we present a critical fault-based methodology to generate high-quality SDD patterns. By focusing on critical faults, high quality original pattern repository could be generated applicably with n-detect ATPG. Novel pattern evaluation and selection method is presented to further minimize pattern count while maintaining the SDD detection ability. Finally, top-off ATPG is performed to ensure meeting the target fault coverage. Experimental results demonstrate that the proposed critical fault-based method improves long path sensitization efficiency by 2.5X and saves approximately 80% CPU runtime compared with total fault-based method. Comparing with timing-aware ATPG, our pattern set detects equivalent or even more SDDs with significantly reduced pattern count.
INDEX TERMS
Circuit faults, Automatic test pattern generation, Runtime, Benchmark testing, Delay
CITATION
"Critical Fault-Based Pattern Generation for Screening SDDs", 2011 16th IEEE European Test Symposium (ETS), vol. 00, no. , pp. 177-182, 2011, doi:10.1109/ETS.2011.26
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