The Community for Technology Leaders
2013 18th IEEE European Test Symposium (ETS) (2009)
Sevilla, Spain
May 25, 2009 to May 29, 2009
ISSN: 1530-1877
ISBN: 978-0-7695-3703-0
TABLE OF CONTENTS
Papers

[Cover art] (PDF)

pp. C1

Table of contents (PDF)

pp. v-vii

Best Paper Award (PDF)

pp. xii
Papers

Title Page i (PDF)

pp. i

Title Page iii (PDF)

pp. iii

Foreword (PDF)

pp. viii

Author Index (PDF)

pp. 169-170
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