Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment
2009 14th IEEE European Test Symposium (2009)
May 25, 2009 to May 29, 2009
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ETS.2009.38
This paper reports the experience being made during the implementation of low pin count techniques and their insertion into a production environment. The techniques applied are "on-loadboard compare" and "shared driver". Already known on a concept level for an on-chip approach, in this paper the transfer to an on-loadboard solution is presented. Emphasis is put on production related aspects. Practical experience, challenges, and pitfalls are described to allow a better assessment of risks and benefits of the investigated methods.
M. Beck et al., "Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment," 2009 14th IEEE European Test Symposium(ETS), Sevilla, Spain, 2009, pp. 39-44.