The Community for Technology Leaders
2013 18th IEEE European Test Symposium (ETS) (2006)
Southampton, United Kingdom
May 21, 2006 to May 21, 2006
ISSN: 1530-1877
ISBN: 0-7695-2566-0
pp: 219-224
Jean Durupt , LETI - CEA, France
Xuan-Tu Tran , LETI - CEA, France
Chantal Robach , LCIS - INPG, France
Vincent Beroulle , LCIS -INPG, France
Francois BERTRAND Bertrand , LETI - CEA, France
The Networks-on-Chip (NoCs) paradigm is emerging as a solution for the communication of SoCs. Many NoC architecture propositions are presented but few works on testing these network architectures. <p>To test the SoCs, the main challenge is to reach into the embedded cores (i.e, the IPs). In this case, the DFT techniques that integrate test architectures into the SoCs to ease the test of these SoCs are really favoured. In this paper, we present a new methodology for testing NoC architectures. A modular, generic, scalable and configurable DFT architecture is developed in order to ease the test of NoC architectures. The target of this test architecture is asynchronous NoC architectures that are implemented in GALS systems. The proposed architecture is therefore named ANoC-TEST and is implemented in QDI asynchronous circuits. In addition, this architecture can be used to test the computing resources of the networked SoCs. Some initial results and conclusions are also given.</p>
Jean Durupt, Xuan-Tu Tran, Chantal Robach, Vincent Beroulle, Francois BERTRAND Bertrand, "A DFT Architecture for Asynchronous Networks-on-Chip", 2013 18th IEEE European Test Symposium (ETS), vol. 00, no. , pp. 219-224, 2006, doi:10.1109/ETS.2006.3
95 ms
(Ver 3.3 (11022016))