The Community for Technology Leaders
2015 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) (2015)
Beijing, China
Oct. 22, 2015 to Oct. 23, 2015
ISBN: 978-1-4673-7899-4
TABLE OF CONTENTS

[Title page] (PDF)

pp. i

Preface (PDF)

pp. i

Committee (PDF)

pp. i-iii

Table of contents (PDF)

pp. i-iv

Language Matters (Abstract)

pp. 1-10
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