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Evolvable Hardware, NASA/DoD Conference on (2005)
Washington DC,
June 29, 2005 to July 1, 2005
ISSN: 1550-6029
ISBN: 0-7695-2399-4
pp: 280-289
Lucian Prodan , "Politehnica" University
Mihai Udrescu , "Politehnica" University
Mircea Vladutiu , "Politehnica" University
ABSTRACT
This paper proposes an original approach to the reliability analysis for Embryonics [4], by introducing the accuracy threshold measure, borrowed from fault-tolerant quantum computing theory, as one of the main parameters for our qualitative assessment. The validity of this technique is proven by comparison with the classical reliability results; furthermore, it brings new perspectives on designing reliable embryonic memory structures at both the molecular and the cellular levels. Appropriate design principles are provided on both information encoding (concatenated codes) and storage (fault tolerant memory structures).
INDEX TERMS
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CITATION
Lucian Prodan, Mihai Udrescu, Mircea Vladutiu, "Survivability of Embryonic Memories: Analysis and Design Principles", Evolvable Hardware, NASA/DoD Conference on, vol. 00, no. , pp. 280-289, 2005, doi:10.1109/EH.2005.44
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