2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) (2002)
Washington, D.C., USA
June 23, 2002 to June 26, 2002
Ram Chillarege , CHILLAREGE INC.
Kothanda Ram Prasad , CHILLAREGE INC.
<p>We present a case study of a product development retrospective analysis conducted to gain an understanding of the test and development process effectiveness. Orthogonal Defect Classification (ODC) is used as an analysis method to gain insight beyond what classical qualitative analysis would yield for the probable cause of delays during test. <li>1. ODC Trigger analysis provides the insight to understand the degree of blockage in test, probable cause, and consequences to the test and development process.</li> <li>2.Trigger distribution changes with respect to time shows the stabilization of the product, and variation among components shows the systemic nature of issues.</li> <li>3. The study makes nine specific inferences and recommendations based on these analyses to guide the engineering of future releases</li></p>
Ram Chillarege, Kothanda Ram Prasad, "Test and Development Process Retrospective — A Case Study using ODC Triggers", 2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), vol. 00, no. , pp. 669, 2002, doi:10.1109/DSN.2002.1029012