The MegaM@Rt2 ECSEL Project: MegaModelling at Runtime — Scalable Model-Based Framework for Continuous Development and Runtime Validation of Complex Systems
2017 Euromicro Conference on Digital System Design (DSD) (2017)
Aug. 30, 2017 to Sept. 1, 2017
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DSD.2017.50
A major challenge for the European electronic industry is to enhance productivity while reducing costs and ensuring quality in development, integration and maintenance. Model-Driven Engineering (MDE) principles and techniques have already shown promising capabilities but still need to scale to support real-world scenarios implied by the full deployment and use of complex electronic components and systems. Moreover, maintaining efficient traceability, integration and communication between two fundamental system life-time phases (design time and runtime) is another challenge facing scalability of MDE. This paper presents an overview of the ECSEL project entitled "MegaModelling at runtime -- Scalable model-based framework for continuous development and runtime validation of complex systems" (MegaM@Rt2), whose aim is to address the above mentioned challenges facing MDE. Driven by both large and small industrial enterprises, with the support of research partners and technology providers, MegaM@Rt2 aims to deliver a framework of tools and methods for: 1) system engineering/design & continuous development, 2) related runtime analysis and 3) global model & traceability management, respectively. The diverse industrial use cases (covering domains such as aeronautics, railway, construction and telecommunications) will integrate and apply such a framework that shall demonstrate the validation of the MegaM@Rt2 solution.
Runtime, Tools, Analytical models, Productivity, Monitoring, Software, Computer architecture
W. Afzal et al., "The MegaM@Rt2 ECSEL Project: MegaModelling at Runtime — Scalable Model-Based Framework for Continuous Development and Runtime Validation of Complex Systems," 2017 Euromicro Conference on Digital System Design (DSD), Vienna, Austria, 2017, pp. 494-501.