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8th Euromicro Conference on Digital System Design (DSD'05) (2005)
Porto, Portugal
Aug. 30, 2005 to Sept. 3, 2005
ISBN: 0-7695-2433-8
pp: 176-183
Tun Li , National University of Defense Technology, China
Dan Zhu , National University of Defense Technology, China
Yang Guo , National University of Defense Technology, China
GongJie Liu , National University of Defense Technology, China
SiKun Li , National University of Defense Technology, China
ABSTRACT
<p>A novel specification driven and constraints solving based method to automatically generate test programs from simple to complex ones for advanced microprocessors is presented in this paper. Our microprocessor architectural automatic test program generator (MA2TG) can produce not only random test programs but also a sequence of instructions for a specific constraint by specifying a user constraints file. The proposed methodology makes three important contributions. First, it simplifies the microprocessor architecture modeling and eases adoption of architecture modification via architecture description language (ADL) specification. Second, it generates test programs for specific constraints utilizing the power of state-to-art constraints solving techniques. Finally, the number of test program for microprocessor verification and the verification time are dramatically reduced. We applied this method on DLX processor to illustrate the usefulness of our approach.</p>
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CITATION

S. Li, Y. Guo, D. Zhu, T. Li and G. Liu, "MA2TG: A Functional Test Program Generator for Microprocessor Verification," 8th Euromicro Conference on Digital System Design (DSD'05)(DSD), Porto, Portugal, 2005, pp. 176-183.
doi:10.1109/DSD.2005.54
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