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2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) (2015)
Amherst, MA, USA
Oct. 12, 2015 to Oct. 14, 2015
ISBN: 978-1-5090-0312-9
TABLE OF CONTENTS

[Front matter] (PDF)

pp. i-xiv

Evaluating the impact of spike and flicker noise in phase change memories (Abstract)

Salin Junsangsri , Electrical and Computer Engineering Department, Northeastern University, Boston, USA
Fabrizio Lombardi , Electrical and Computer Engineering Department, Northeastern University, Boston, USA
Jie Han , Electrical and Computer Engineering Department, University of Alberta, Edmonton, Canada
pp. 1-6

Fault detection and repair of DSC arrays through memristor sensing (Abstract)

J. Mathew , University of Bristol, UK
Y. Yang , University of Bristol, UK
M. Ottavia , University of Rome “Tor Vergata” Italy
T. Browna , University of Rome “Tor Vergata” Italy
A. Zampettia , University of Rome “Tor Vergata” Italy
A. Di Carloa , University of Rome “Tor Vergata” Italy
A. M. Jabirb , Oxford Brookes University, UK
D. K. Pradhan , University of Bristol, UK
pp. 7-12

Asymmetric ECC organization in 3D-memory via spare column utilization (Abstract)

Hyunseung Han , Department of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon, Korea
Joon-Sung Yang , Department of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon, Korea
pp. 13-16

Exploring error-tolerant low-power multiple-output read scheme for memristor-based memory arrays (Abstract)

Adedotun A. Adeyemo , Department of Computing and Communication Technologies, Oxford Brookes University, UK
Jimson Mathew , Computer Science Department, University of Bristol, UK
Abusaleh M. Jabir , Department of Computing and Communication Technologies, Oxford Brookes University, UK
Dhiraj K. Pradhan , Computer Science Department, University of Bristol, UK
pp. 17-20

RotR: Rotational redundant task mapping for fail-operational MPSoCs (Abstract)

Badrun Nahar , Electrical and Computer Engineering, McGill University, Montréal, Québec, Canada
Brett H. Meyer , Electrical and Computer Engineering, McGill University, Montréal, Québec, Canada
pp. 21-28

On enhancing the debug architecture of a system-on-chip (SoC) to detect software attacks (Abstract)

Jerry Backer , Polytechnic School of Engineering, New York University, Brooklyn, 11201, USA
David Hely , Université Grenoble Alpes, LCIS, F-26000, Valence, France
Ramesh Karri , Polytechnic School of Engineering, New York University, Brooklyn, 11201, USA
pp. 29-34

Software-based on-chip thermal sensor calibration for DVFS-enabled many-core systems (Abstract)

Sami Teravainen , Department of Information Technology, University of Turku, Finland
Mohammad-Hashem Haghbayan , Department of Information Technology, University of Turku, Finland
Amir-Mohammad Rahmani , Department of Information Technology, University of Turku, Finland
Pasi Liljeberg , Department of Information Technology, University of Turku, Finland
Hannu Tenhunen , Department of Information Technology, University of Turku, Finland
pp. 35-40

Single Event Upsets and Hot Pixels in digital imagers (Abstract)

Glenn H. Chapman , School of Engineering Science, Simon Fraser University, Burnaby, B.C., Canada, V5A 1S6
Rahul Thomas , School of Engineering Science, Simon Fraser University, Burnaby, B.C., Canada, V5A 1S6
Rohan Thomas , School of Engineering Science, Simon Fraser University, Burnaby, B.C., Canada, V5A 1S6
Klinsmann J. Coelho Silva Meneses , School of Engineering Science, Simon Fraser University, Burnaby, B.C., Canada, V5A 1S6
Tommy Q. Yang , School of Engineering Science, Simon Fraser University, Burnaby, B.C., Canada, V5A 1S6
Israel Koren , Dept. of Electrical and Computer Engineering, University of Massachusetts, Amherst, 01003, USA
Zahava Koren , Dept. of Electrical and Computer Engineering, University of Massachusetts, Amherst, 01003, USA
pp. 41-46

Accelerated microarchitectural Fault Injection-based reliability assessment (Abstract)

Manolis Kaliorakis , Department of Informatics and Telecommunications, University of Athens, Greece
Sotiris Tselonis , Department of Informatics and Telecommunications, University of Athens, Greece
Athanasios Chatzidimitriou , Department of Informatics and Telecommunications, University of Athens, Greece
Dimitris Gizopoulos , Department of Informatics and Telecommunications, University of Athens, Greece
pp. 47-52

Hot spare components for performance-cost improvement in multi-core SIMT (Abstract)

S. Hasan Mozafari , Department Electrical and Computer Engineering, McGill University, Montréal, QC, Canada
Brett H. Meyer , Department Electrical and Computer Engineering, McGill University, Montréal, QC, Canada
pp. 53-59

Low-overhead fault-tolerance for the preconditioned conjugate gradient solver (Abstract)

Alexander Scholl , Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Pfaffenwaldring 47, D-70569, Germany
Claus Braun , Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Pfaffenwaldring 47, D-70569, Germany
Michael A. Kochte , Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Pfaffenwaldring 47, D-70569, Germany
Hans-Joachim Wunderlich , Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Pfaffenwaldring 47, D-70569, Germany
pp. 60-65

On-line detection of intermittent faults in digital-to-analog converters (Abstract)

Mani Soma , Department of Electrical Engineering, University of Washington, USA
pp. 66-71

A Dual-Layer Fault Manager for systems based on Xilinx Virtex FPGAs (Abstract)

I. Herrera-Alzu , Dept. of Electronics Engineering, E.T.S.I. Telecomunicación, Universidad Politécnica de Madrid, Spain
M. Lopez-Vallejo , Dept. of Electronics Engineering, E.T.S.I. Telecomunicación, Universidad Politécnica de Madrid, Spain
C. Gil Soriano , Dept. of Electronics Engineering, E.T.S.I. Telecomunicación, Universidad Politécnica de Madrid, Spain
pp. 72-75

REPAIR: Hard-error recovery via re-execution (Abstract)

Jyothish Soman , Computer Laboratory, University of Cambridge, UK
Negar Miralaei , Computer Laboratory, University of Cambridge, UK
Alan Mycroft , Computer Laboratory, University of Cambridge, UK
Timothy M. Jones , Computer Laboratory, University of Cambridge, UK
pp. 76-79

A method to protect Bloom filters from soft errors (Abstract)

Pedro Reviriego , Universidad Antonio de Nebrija, C/ Pirineos, 55 E-28040 Madrid, Spain
Salvatore Pontarelli , Consorzio Nazionale Interuniversitario per le Telecomunicazioni, CNIT, Italy
Juan Antonio Maestro , Universidad Antonio de Nebrija, C/ Pirineos, 55 E-28040 Madrid, Spain
Marco Ottavi , University of Rome “Tor Vergata”, Via del Politecnico 1 - 00133, Italy
pp. 80-84

Influence of triple-well technology on laser fault injection and laser sensor efficiency (Abstract)

N. Borrel , STMicroelectronics, Avenue Célestin Coq - ZI de Rousset, 13106, France
C. Champeix , STMicroelectronics, Avenue Célestin Coq - ZI de Rousset, 13106, France
E. Kussener , Aix Marseille Université, CNRS, Université de Toulon, ISEN, IM2NP UMR 7334, 13397, France
W. Rahajandraibe , Aix Marseille Université, CNRS, Université de Toulon, ISEN, IM2NP UMR 7334, 13397, France
M. Lisart , STMicroelectronics, Avenue Célestin Coq - ZI de Rousset, 13106, France
A. Sarafianos , Aix Marseille Université, CNRS, Université de Toulon, ISEN, IM2NP UMR 7334, 13397, France
J-M. Dutertre , Ecole Nat. Sup. des Mines de St-Etienne, LSAS, CMP, 880 route de Mimet, 13541 Gardanne, France
pp. 85-90

Using value similarity of registers for soft error mitigation (Abstract)

Abdulaziz Eker , Dept, of Computer Engineering, TOBB University of Economics and Technology, Ankara, Turkey
Oguz Ergin , Dept, of Computer Engineering, TOBB University of Economics and Technology, Ankara, Turkey
pp. 91-96

Security analysis of logic encryption against the most effective side-channel attack: DPA (Abstract)

Muhammad Yasin , New York University, USA
Bodhisatwa Mazumdar , New York University, Abu Dhabi, USA
Sk Subidh Ali , New York University, Abu Dhabi, USA
Ozgur Sinanoglu , New York University, Abu Dhabi, USA
pp. 97-102

Reliable hash trees for post-quantum stateless cryptographic hash-based signatures (Abstract)

Mehran Mozaffari-Kermani , Department of Electrical and Microelectronic Engineering, Rochester Institute of Technology, NY 14623, USA
Reza Azarderakhsh , Department of Computer Engineering, Rochester Institute of Technology, NY 14623, USA
pp. 103-108

Chip-level anti-reverse engineering using transformable interconnects (Abstract)

Shuai Chen , Department of Electrical and Computer Engineering, University of Connecticut, Storrs, 06269, USA
Junlin Chen , Department of Electrical and Computer Engineering, University of Connecticut, Storrs, 06269, USA
Domenic Forte , Department of Electrical and Computer Engineering, University of Connecticut, Storrs, 06269, USA
Jia Di , Department of Computer Science and Computer Engineering, University of Arkansas, Fayetteville, 72701, USA
Mark Tehranipoor , Department of Electrical and Computer Engineering, University of Connecticut, Storrs, 06269, USA
Lei Wang , Department of Electrical and Computer Engineering, University of Connecticut, Storrs, 06269, USA
pp. 109-114

Scan attack on Elliptic Curve Cryptosystem (Abstract)

Sk Subidh Ali , New York University Abu Dhabi (NYUAD), USA
Ozgur Sinanoglu , New York University Abu Dhabi (NYUAD), USA
pp. 115-118

Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation (Abstract)

Senwen Kan , Austin Design Center, Advanced Micro Devices, Texas 78735, USA
Marco Ottavi , Department of Electronic Engineering, University of Rome Tor Vergata, Italy
Jennifer Dworak , Dept. of Computer Science & Engineering, Southern Methodist University, Dallas, Texas, USA
pp. 119-122

A BIST approach for counterfeit circuit detection based on NBTI degradation (Abstract)

Puneet Ramesh Savanur , Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, 62901, USA
Phaninder Alladi , Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, 62901, USA
Spyros Tragoudas , Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, 62901, USA
pp. 123-126

Quest for a quantum search algorithm for testing stuck-at faults in digital circuits (Abstract)

Muralidharan Venkatasubramanian , Department of Electrical and Computer Engineering, Auburn University, Alabama 36849, USA
Vishwani D. Agrawal , Department of Electrical and Computer Engineering, Auburn University, Alabama 36849, USA
James J. Janaher , Department of Electrical and Computer Engineering, Auburn University, Alabama 36849, USA
pp. 127-132

Piecewise-functional broadside tests based on intersections of reachable states (Abstract)

Irith Pomeranz , School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907, U.S.A.
pp. 133-138

Predictive LBIST model and partial ATPG for seed extraction (Abstract)

G. Contreras , University of Connecticut, USA
N. Ahmed , Freescale Semiconductor, Inc., USA
L. Winemberg , Freescale Semiconductor, Inc., USA
M. Tehranipoor , University of Connecticut, USA
pp. 139-146

A CMOS ripple detector for integrated voltage regulator testing (Abstract)

Cagatay Ozmen , Department of Electrical and Computer Engineering, University of Massachusetts Lowell, USA
Aydin Dirican , Department of Electrical and Computer Engineering, University of Massachusetts Lowell, USA
Nurettin Tan , Department of Electrical and Computer Engineering, University of Massachusetts Lowell, USA
Hieu Nguyen , Department of Electrical and Computer Engineering, University of Massachusetts Lowell, USA
Martin Margala , Department of Electrical and Computer Engineering, University of Massachusetts Lowell, USA
pp. 147-150

Adaptive fault simulation on many-core microprocessor systems (Abstract)

Mohammad-Hashem Haghbayan , Department of Information Technology, University of Turku, Finland
Sami Teravainen , Department of Information Technology, University of Turku, Finland
Amir-Mohammad Rahmani , Department of Information Technology, University of Turku, Finland
Pasi Liljeberg , Department of Information Technology, University of Turku, Finland
Hannu Tenhunen , Department of Information Technology, University of Turku, Finland
pp. 151-154

Compacting output responses containing unknowns using an embedded processor (Abstract)

Kamran Saleem , Computer Engineering Research Center, University of Texas, Austin, 78712, USA
Sreenivaas S. Muthyala , Computer Engineering Research Center, University of Texas, Austin, 78712, USA
Nur A. Touba , Computer Engineering Research Center, University of Texas, Austin, 78712, USA
pp. 155-160

Impact of test compression on power supply noise control (Abstract)

Tengteng Zhang , Department of Computer and Science Engineering, Texas A&M University College station, 77845, USA
D.M.H. Walker , Department of Computer and Science Engineering, Texas A&M University College station, 77845, USA
pp. 161-166

Improving X-tolerant combinational output compaction via input rotation (Abstract)

Asad Amin Bawa , Computer Engineering Research Center, University of Texas, 78712, USA
Nur A. Touba , Computer Engineering Research Center, University of Texas, 78712, USA
pp. 167-170

Low-power LDPC decoder design exploiting memory error statistics (Abstract)

Junlin Chen , Department of Electrical and Computer Engineering, University of Connecticut, Storrs, 06269, USA
Lei Wang , Department of Electrical and Computer Engineering, University of Connecticut, Storrs, 06269, USA
pp. 171-176

SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology (Abstract)

Clement Champeix , STMicroelectronics, Secure Microcontrollers Division (SMD), 190 avenue Celestin Coq, 13106 Rousset, France
Nicolas Borrel , STMicroelectronics, Secure Microcontrollers Division (SMD), 190 avenue Celestin Coq, 13106 Rousset, France
Jean-Max Dutertre , Ecole Nationale Supérieure des Mines de Saint-Etienne, Laboratoire Secure Architectures and Systems (LSAS), Centre de Microélectronique de Provence, 880 route de Mimet, 13541 Gardanne, France
Bruno Robisson , CEA Cadarache, 13108, Saint-Paul-lez-Durance, France
Mathieu Lisart , STMicroelectronics, Secure Microcontrollers Division (SMD), 190 avenue Celestin Coq, 13106 Rousset, France
Alexandre Sarafianos , STMicroelectronics, Secure Microcontrollers Division (SMD), 190 avenue Celestin Coq, 13106 Rousset, France
pp. 177-182

Approximate compressors for error-resilient multiplier design (Abstract)

Zhixi Yang , Sch. of Mechatronics and Automation, National University of Defense Technology, Changsha, Hunan, China
Jie Han , Dept. of Electrical and Computer Engineering, University of Alberta, Edmonton, Canada
Fabrizio Lombardi , Dept. of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA
pp. 183-186

Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics (Abstract)

Daniele Felici , University of Rome “Tor Vergata”, Italy
Sandro Bonacini , CERN, Switzerland
Marco Ottavi , University of Rome “Tor Vergata”, Italy
pp. 187-190

Reducing the performance overhead of resilient CMPs with substitutable resources (Abstract)

A. Malek , Computer Science and Engineering Department, Chalmers University of Technology, Sweden
S. Tzilis , Computer Science and Engineering Department, Chalmers University of Technology, Sweden
D.A. Khan , Computer Science and Engineering Department, Chalmers University of Technology, Sweden
I. Sourdis , Computer Science and Engineering Department, Chalmers University of Technology, Sweden
G. Smaragdos , Neuroscience Department, Erasmus Medical Center, The Netherlands
C. Strydis , Neuroscience Department, Erasmus Medical Center, The Netherlands
pp. 191-196

Dependable real-time task execution scheme for a many-core platform (Abstract)

Tomohiro Yoneda , National Institute of Informatics, Japan
Masashi Imai , Hirosaki University, Japan
Hiroshi Saito , University of Aizu, Japan
Kenji Kise , Tokyo Institute of Technology, Japan
pp. 197-204

Towards reliability and performance-aware Wireless Network-on-Chip design (Abstract)

Michael Opoku Agyeman , Department of Computer Science and Engineering, The Chinese University of Hong Kong, China
Kin-Fai Tong , Department of Electrical and Electronic Engineering, UCL, London, UK
Terrence Mak , Department of Computer Science and Engineering, The Chinese University of Hong Kong, China
pp. 205-210

A fast and scalable fault injection framework to evaluate multi/many-core soft error reliability (Abstract)

Felipe Rosa , UFRGS - Instituto de Informatica - PGMicro/PPGC, Av. Bento Goncalves 9500 Porto Alegre, RS - Brazil
Fernanda Kastensmidt , UFRGS - Instituto de Informatica - PGMicro/PPGC, Av. Bento Goncalves 9500 Porto Alegre, RS - Brazil
Ricardo Reis , UFRGS - Instituto de Informatica - PGMicro/PPGC, Av. Bento Goncalves 9500 Porto Alegre, RS - Brazil
Luciano Ost , Department of Engineering - University of Leicester, University Road, LE1 7RH, UK
pp. 211-214

A cross-layer approach to online adaptive reliability prediction of transient faults (Abstract)

Bahar Farahani , School of Electrical and Computer Engineering, University of Tehran, Iran
Saeed Safari , School of Electrical and Computer Engineering, University of Tehran, Iran
pp. 215-220

A non-conservative software-based approach for detecting illegal CFEs caused by transient faults (Abstract)

Diego Rodrigues , Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil
Ghazaleh Nazarian , Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, The Netherlands
Alvaro Moreira , Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil
Luigi Carro , Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil
Georgi Gaydadjiev , Department of Computer Science and Engineering, Chalmers University of Technology, Gothenburg, Sweden
pp. 221-226

A configurable board-level adaptive incremental diagnosis technique based on decision trees (Abstract)

Cristiana Bolchini , Dipartimento di Elettronica, Informazione e Bioingegneria - Politecnico di Milano, Italy
Luca Cassano , Dipartimento di Elettronica, Informazione e Bioingegneria - Politecnico di Milano, Italy
pp. 227-232

IntelliCAN: Attack-resilient Controller Area Network (CAN) for secure automobiles (Abstract)

Mohammad Raashid Ansari , Department of Electrical and Computer Engineering, University of New Hampshire, Durham, 03824, USA
Shucheng Yu , Department of Computer Science, University of Arkansas at Little Rock, 72204, USA
Qiaoyan Yu , Department of Electrical and Computer Engineering, University of New Hampshire, Durham, 03824, USA
pp. 233-236
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