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2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (2016)
Storrs, CT, USA
Sept. 19, 2016 to Sept. 20, 2016
ISSN: 2377-7966
ISBN: 978-1-5090-3624-0
pp: 131-134
Gianluca Furano , European Space Agency, European Space Technology Centre, Noordwijk, The Netherlands
Stefano Di Mascio , University of Rome Tor Vergata, Department of Electronic Engineering, Rome, Italy
Tomasz Szewczyk , European Space Agency, European Space Technology Centre, Noordwijk, The Netherlands
Alessandra Menicucci , Delft University of Technology, Faculty of Aerospace Engineering, Space Systems Engineering, The Netherlands
Luigi Campajola , University of Naples Federico II, Department of Physics E. Pancini, Naples, Italy
Francesco Di Capua , University of Naples Federico II, Department of Physics E. Pancini, Naples, Italy
Andrea Fabbri , INFN, Roma Tre Section, Rome, Italy
Marco Ottavi , University of Rome Tor Vergata, Department of Electronic Engineering, Rome, Italy
ABSTRACT
This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.
INDEX TERMS
Protons, Aerospace electronics, Random access memory, Ions, Clocks, Microcontrollers, Testing
CITATION
Gianluca Furano, Stefano Di Mascio, Tomasz Szewczyk, Alessandra Menicucci, Luigi Campajola, Francesco Di Capua, Andrea Fabbri, Marco Ottavi, "A novel method for SEE validation of complex SoCs using Low-Energy Proton beams", 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), vol. 00, no. , pp. 131-134, 2016, doi:10.1109/DFT.2016.7684084
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