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2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (2014)
Amsterdam, Netherlands
Oct. 1, 2014 to Oct. 3, 2014
ISBN: 978-1-4799-6154-2
TABLE OF CONTENTS

[Front matter] (PDF)

pp. i-xvi

Estimating the effect of single-event upsets on microprocessors (Abstract)

Cristian Constantinescu , Advanced Micro Devices, Inc., Fort Collins, CO, USA
Srini Krishnamoorthy , Advanced Micro Devices, Inc., Sunnyvale, CA, USA
Tuyen Nguyen , Advanced Micro Devices, Inc., Austin, TX, USA
pp. 185-190

A system-level scheme for resistance drift tolerance of a multilevel phase change memory (Abstract)

Pilin Junsangsri , Department of Electrical and Computer Engineering, Northeastern University, Boston, MA 02115, USA
Jie Han , Department of Electrical and Computer Engineering, Northeastern University, Boston, MA 02115, USA
Fabrizio Lombardi , Department of Electrical and Computer Engineering, Northeastern University, Boston, MA 02115, USA
pp. 63-68

Designs and analysis of non-volatile memory cells for single event upset (SEU) tolerance (Abstract)

Wei Wei , Department of Electrical and Computer Engineering, Northeastern University, Boston, USA
Fabrizio Lombardi , Department of Electrical and Computer Engineering, Northeastern University, Boston, USA
Kazuteru Namba , Graduate School of Advanced Integration Science, Chiba University, Chiba, Japan
pp. 69-74

Scheduling algorithm in datapath synthesis for long duration transient fault tolerance (Abstract)

Tsuyoshi Iwagaki , Graduate School of Information Sciences, Hiroshima City University, Asa-minami, Hiroshima 731-3194, Japan
Tatsuya Nakaso , Graduate School of Information Sciences, Hiroshima City University, Asa-minami, Hiroshima 731-3194, Japan
Ryoko Ohkubo , Graduate School of Information Sciences, Hiroshima City University, Asa-minami, Hiroshima 731-3194, Japan
Hideyuki Ichihara , Graduate School of Information Sciences, Hiroshima City University, Asa-minami, Hiroshima 731-3194, Japan
Tomoo Inoue , Graduate School of Information Sciences, Hiroshima City University, Asa-minami, Hiroshima 731-3194, Japan
pp. 128-133

Power droop reduction during Launch-On-Shift scan-based logic BIST (Abstract)

M. Omana , ARCES - DEI, University of Bologna, Bologna, Italy
D. Rossi , ARCES - DEI, University of Bologna, Bologna, Italy
E. Beniamino , ARCES - DEI, University of Bologna, Bologna, Italy
C. Metra , ARCES - DEI, University of Bologna, Bologna, Italy
C. Tirumurti , Intel Corporation Santa Clara, CA
R. Galivanche , Intel Corporation Santa Clara, CA
pp. 21-26

Machine learning-based techniques for incremental functional diagnosis: A comparative analysis (Abstract)

Cristiana Bolchini , Dip. Elettronica, Informazione e Bioingegneria - Politecnico di Milano, Italy
Luca Cassano , Dip. Elettronica, Informazione e Bioingegneria - Politecnico di Milano, Italy
pp. 246-251

Exploiting dynamic partial reconfiguration for on-line on-demand testing of permanent faults in reconfigurable systems (Abstract)

Domenico Sorrenti , Department of Information Engineering, University of Pisa, Italy
Dario Cozzi , Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany
Sebastian Korf , Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany
Luca Cassano , Department of Information Engineering, University of Pisa, Italy
Jens Hagemeyer , Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany
Mario Porrmann , Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany
Cinzia Bernardeschi , Department of Information Engineering, University of Pisa, Italy
pp. 203-208

Artificial intelligence based task mapping and pipelined scheduling for checkpointing on real time systems with imperfect fault detection (Abstract)

Anup Das , Department of Electrical and Computer Engineering, National University of Singapore, Singapore - 117583
Akash Kumar , Department of Electrical and Computer Engineering, National University of Singapore, Singapore - 117583
Bharadwaj Veeravalli , Department of Electrical and Computer Engineering, National University of Singapore, Singapore - 117583
pp. 134-140

TSV-to-TSV inductive coupling-aware coding scheme for 3D Network-on-Chip (Abstract)

Ashkan Eghbal , Center for Pervasive Communications and Computing, Department of Electrical Engineering and Computer Science, University of California, Irvine
Pooria M. Yaghini , Center for Pervasive Communications and Computing, Department of Electrical Engineering and Computer Science, University of California, Irvine
Siavash S. Yazdi , Center for Pervasive Communications and Computing, Department of Electrical Engineering and Computer Science, University of California, Irvine
Nader Bagherzadeh , Center for Pervasive Communications and Computing, Department of Electrical Engineering and Computer Science, University of California, Irvine
pp. 92-97

Automated formal approach for debugging dividers using dynamic specification (Abstract)

Mohammad-Hashem Haghbayan , Department of Information Technology, University of Turku, Turku, Finland
Bijan Alizadeh , School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran
Amir-Mohammad Rahmani , Department of Information Technology, University of Turku, Turku, Finland
Pasi Liljeberg , Department of Information Technology, University of Turku, Turku, Finland
Hannu Tenhunen , Department of Information Technology, University of Turku, Turku, Finland
pp. 264-269

Characterization of data retention faults in DRAM devices (Abstract)

Angelo Bacchini , Dept. of Electronic Engineering, University of Rome Tor Vergata
Marco Rovatti , European Space Agency
Gianluca Furano , European Space Agency
Marco Ottavi , Dept. of Electronic Engineering, University of Rome Tor Vergata
pp. 9-14

Decreasing FIT with diverse triple modular redundancy in SRAM-based FPGAs (Abstract)

Lucas A. Tambara , UFRGS - Institute de Informätica - PPGC - PGMICRO, Porto Alegre - Brazil
Fernanda Lima Kastensmidt , UFRGS - Institute de Informätica - PPGC - PGMICRO, Porto Alegre - Brazil
Paolo Rech , UFRGS - Institute de Informätica - PPGC - PGMICRO, Porto Alegre - Brazil
Christopher Frost , Rutherford Appleton Laboratory - ISIS, Didcot, Oxford, U.K.
pp. 153-158

Characterizing soft error vulnerability of cache coherence protocols for chip-multiprocessors (Abstract)

Chuanlei Zheng , State Key Laboratory of Novel Software Technology, Department of Computer Science and Technology Nanjing University, Nanjing, Jiang Su 210046, China
Shuai Wang , State Key Laboratory of Novel Software Technology, Department of Computer Science and Technology Nanjing University, Nanjing, Jiang Su 210046, China
pp. 15-20

Diagnostic self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults (Abstract)

Mario Scholzel , Brandenburg University of Technology, Cottbus, Germany
Tobias Koal , Brandenburg University of Technology, Cottbus, Germany
Heinrich T. Vierhaus , Brandenburg University of Technology, Cottbus, Germany
pp. 27-32

A fault injection methodology and infrastructure for fast single event upsets emulation on Xilinx SRAM-based FPGAs (Abstract)

Stefano Di Carlo , Politecnico di Torino, Dipartimento di Automatica e Informatica, Corso Duca degli Abruzzi 24, I-10129, Torino, Italy
Paolo Prinetto , Politecnico di Torino, Dipartimento di Automatica e Informatica, Corso Duca degli Abruzzi 24, I-10129, Torino, Italy
Daniele Rolfo , Politecnico di Torino, Dipartimento di Automatica e Informatica, Corso Duca degli Abruzzi 24, I-10129, Torino, Italy
Pascal Trotta , Politecnico di Torino, Dipartimento di Automatica e Informatica, Corso Duca degli Abruzzi 24, I-10129, Torino, Italy
pp. 159-164

A probabilistic analysis of resilient reconfigurable designs (Abstract)

A. Malek , Computer Science and Engineering Department, Chalmers University of Technology, Sweden
S. Tzilis , Computer Science and Engineering Department, Chalmers University of Technology, Sweden
D. A. Khan , Computer Science and Engineering Department, Chalmers University of Technology, Sweden
I. Sourdis , Computer Science and Engineering Department, Chalmers University of Technology, Sweden
G. Smaragdos , Neuroscience Department, Erasmus Medical Center, The Netherlands
C. Strydis , Neuroscience Department, Erasmus Medical Center, The Netherlands
pp. 141-146

Energy-efficient concurrent testing approach for many-core systems in the dark silicon age (Abstract)

Mohammad-Hashem Haghbayan , Department of Information Technology, University of Turku, Turku, Finland
Amir-Mohammad Rahmani , Department of Information Technology, University of Turku, Turku, Finland
Pasi Liljeberg , Department of Information Technology, University of Turku, Turku, Finland
Juha Plosila , Department of Information Technology, University of Turku, Turku, Finland
Hannu Tenhunen , Department of Information Technology, University of Turku, Turku, Finland
pp. 270-275

Design and implementation of a self-healing processor on SRAM-based FPGAs (Abstract)

Mihalis Psarakis , University of Piraeus - Dep. of Informatics, Piraeus - Greece
Alexandros Vavousis , University of Piraeus - Dep. of Informatics, Piraeus - Greece
Cristiana Bolchini , Politecnico di Milano - DEIB, Milano - Italy
Antonio Miele , Politecnico di Milano - DEIB, Milano - Italy
pp. 165-170

A built-in calibration system with a reduced FFT engine for linearity optimization of low power LNA (Abstract)

Yongsuk Choi , Dept. of Electrical and Computer Engineering, Northeastern University, Boston, USA
Chun-hsiang Chang , Dept. of Electrical and Computer Engineering, Northeastern University, Boston, USA
In-Seok Jung , Dept. of Electrical and Computer Engineering, Northeastern University, Boston, USA
Marvin Onabajo , Dept. of Electrical and Computer Engineering, Northeastern University, Boston, USA
Yong-Bin Kim , Dept. of Electrical and Computer Engineering, Northeastern University, Boston, USA
pp. 222-227

A 12-bit 32MS/s SAR ADC using built-in self calibration technique to minimize capacitor mismatch (Abstract)

In-Seok Jung , Department of Electrical and Computer Engineering, Northeastern University, Boston, United States
Yong-Bin Kim , Department of Electrical and Computer Engineering, Northeastern University, Boston, United States
pp. 276-280

Unifying scan compression (Abstract)

Swapnil Bahl , Technology Research and Development, STMicroelectronics India
Shreyans Rungta , Technology Research and Development, STMicroelectronics India
Shray Khullar , Technology Research and Development, STMicroelectronics India
Rohit Kapur , Synopsys Inc, Mountain View, CA 94043
Anshuman Chandra , Synopsys Inc, Mountain View, CA 94043
Salvatore Talluto , Synopsys Inc, Mountain View, CA 94043
Pramod Notiyath , Synopsys Inc, Mountain View, CA 94043
Ajay Rajagopalan , Synopsys Inc, Mountain View, CA 94043
pp. 191-196

Fault injection in the process descriptor of a Unix-based operating system (Abstract)

Bartolomeo Montrucchio , Politecnico di Torino, Italy, Dipartimento di Automatica e Informatica
Maurizio Rebaudengo , Politecnico di Torino, Italy, Dipartimento di Automatica e Informatica
Alejandro Velasco , Politecnico di Torino, Italy, Dipartimento di Automatica e Informatica
pp. 281-286

An instance-based SER analysis in the presence of PVTA variations (Abstract)

Bahareh Farahani , School of Electrical and Computer Engineering University of Tehran, Tehran 14395-1515, Iran
Saeed Safari , School of Electrical and Computer Engineering University of Tehran, Tehran 14395-1515, Iran
pp. 287-292

A heuristic path selection method for small delay defects test (Abstract)

Paniz Foroutatf , Department of Computer Engineering, Science and Research Branch, Islamic Azad University, Tehran, Iran
Mehdi Kamal , School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran
Zainalabedin Navabi , School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran
pp. 252-257

Exploiting Intel TSX for fault-tolerant execution in safety-critical systems (Abstract)

Florian Haas , Department of Computer Science University of Augsburg, Germany
Sebastian Weis , Department of Computer Science University of Augsburg, Germany
Stefan Metzlaff , Department of Computer Science University of Augsburg, Germany
Theo Ungerer , Department of Computer Science University of Augsburg, Germany
pp. 197-202

Protecting cryptographic hardware against malicious attacks by nonlinear robust codes (Abstract)

Victor Tomashevich , Faculty of Mathematics and Computer Science, University of Passau, Germany, Innstr. 41, 94032
Yaara Neumeier , Faculty of Engineering, Bar Ilan University, Ramat-Gan 52900, Israel
Raghavan Kumar , University of Massachusetts, 01003 Amherst, USA
Osnat Keren , Faculty of Mathematics and Computer Science, University of Passau, Germany, Innstr. 41, 94032
Ilia Polian , Faculty of Mathematics and Computer Science, University of Passau, Germany, Innstr. 41, 94032
pp. 40-45

GPGPUs ECC efficiency and efficacy (Abstract)

Daniel A. G. Oliveira , Institute of Informatics - Federal University of Rio Grande do Sul - Porto Alegre, Brazil
Paolo Rech , Institute of Informatics - Federal University of Rio Grande do Sul - Porto Alegre, Brazil
Laercio L. Pilla , Department of Informatics and Statistics - CTC - Federal University of Santa Catarina - Florianópolis, Brazil
Philippe O. A. Navaux , Institute of Informatics - Federal University of Rio Grande do Sul - Porto Alegre, Brazil
Luigi Carro , Institute of Informatics - Federal University of Rio Grande do Sul - Porto Alegre, Brazil
pp. 209-215

Rescuing healthy cores against disabled routers (Abstract)

Masoumeh Ebrahimi , KTH Royal Institute of Technology, Sweden
Junshi Wang , University of Electronic Science and Technology of China, China
Letian Huang , University of Electronic Science and Technology of China, China
Masoud Daneshtalab , KTH Royal Institute of Technology, Sweden
Axel Jantsch , KTH Royal Institute of Technology, Sweden
pp. 98-103

Domino effect protection on dataflow error detection and recovery (Abstract)

Tiago A. O. Alves , Programa de Engenharia de Sistemas e Computação - COPPE, Universidade Federal do Rio de Janeiro (UFRJ), Rio de Janeiro, Brazil
Leandro A. J. Marzulo , Instituto de Matemática e Estatística, Universidade do Estado do Rio de Janeiro (UERJ), Rio de Janeiro, Brazil
Sandip Kundi , Department of Electrical and Computer Engineering, University of Massachusetts Amherst
Felipe M. G. Franca , Programa de Engenharia de Sistemas e Computação - COPPE, Universidade Federal do Rio de Janeiro (UFRJ), Rio de Janeiro, Brazil
pp. 147-152

Exploration of system availability during software-based self-testing in many-core systems under test latency constraints (Abstract)

Michael A. Skitsas , KIOS Research Center, University of Cyprus, Nicosia, Cyprus
Chrysostomos A. Nicopoulos , Department of ECE, University of Cyprus, Nicosia, Cyprus
Maria K. Michael , KIOS Research Center, University of Cyprus, Nicosia, Cyprus
pp. 33-39

Preemptive multi-bit IJTAG testing with reconfigurable infrastructure (Abstract)

Shahrzad Keshavarz , School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran
Amirreza Nekooei , School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran
Zainalabedin Navabi , School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran
pp. 293-298

On the in-field functional testing of decode units in pipelined RISC processors (Abstract)

P. Bernardi , Dipartimento di Automatica e Informatica Politecnico di Torino, Torino, Italy
R. Cantoro , Dipartimento di Automatica e Informatica Politecnico di Torino, Torino, Italy
L. Ciganda , Dipartimento di Automatica e Informatica Politecnico di Torino, Torino, Italy
E. Sanchez , Dipartimento di Automatica e Informatica Politecnico di Torino, Torino, Italy
M. Sonza Reorda , Dipartimento di Automatica e Informatica Politecnico di Torino, Torino, Italy
S. De Luca , STMicroelectronics, Agrate Brianza, Italy
R. Meregalli , STMicroelectronics, Agrate Brianza, Italy
A. Sansonetti , STMicroelectronics, Agrate Brianza, Italy
pp. 299-304

A data recomputation approach for reliability improvement of scratchpad memory in embedded systems (Abstract)

Hossein Sayadi , Department of Computer Engineering, Sharif University of Technology, Tehran, Iran 11155-1639
Hamed Farbeh , Department of Computer Engineering, Sharif University of Technology, Tehran, Iran 11155-1639
Amir Mahdi Hosseini Monazzah , Department of Computer Engineering, Sharif University of Technology, Tehran, Iran 11155-1639
Seyed Ghassem Miremadi , Department of Computer Engineering, Sharif University of Technology, Tehran, Iran 11155-1639
pp. 228-233

Performance sensor for tolerance and predictive detection of delay-faults (Abstract)

J. Semiao , ISE - University of Algarve, Faro, Portugal
D. Saraiva , ISE - University of Algarve, Faro, Portugal
C. Leong , INESC-ID, Lisbon, Portugal
A. Romao , Silicongate, Lisbon, Portugal
M. B. Santos , IST / INESC-ID Lisbon, Portugal
I. C. Teixeira , IST / INESC-ID Lisbon, Portugal
J. P. Teixeira , IST / INESC-ID Lisbon, Portugal
pp. 110-115

Reliability estimation at block-level granularity of spin-transfer-torque MRAMs (Abstract)

S. Di Carlo , Politecnico di Torino, Dip. di Automatica e Informatica, Turin, Italy
M. Indaco , Politecnico di Torino, Dip. di Automatica e Informatica, Turin, Italy
P. Prinetto , Politecnico di Torino, Dip. di Automatica e Informatica, Turin, Italy
Elena I. Vatajelu , Politecnico di Torino, Dip. di Automatica e Informatica, Turin, Italy
R. Rodriguez-Montanes , Universität Politécnica de Catalunya (UPC), Dept. of Electronic Engineering, Barcelona, Spain
J. Figueras , Universität Politécnica de Catalunya (UPC), Dept. of Electronic Engineering, Barcelona, Spain
pp. 75-80

Using memristor state change behavior to identify faults in photovoltaic arrays (Abstract)

Jimson Mathew , Department of Computer Science, University of Bristol, UK
Marco Ottavi , University of Rome “Tor Vergata” Italy
Yunfan Yang , Department of Computer Science, University of Bristol, UK
Dhiraj K. Pradhan , Department of Computer Science, University of Bristol, UK
pp. 86-91

Towards an adaptable bit-width NMR voter for multiple error masking (Abstract)

Thiago Berticelli Lo , Departamento de Ensino, Pesquisa e Extensão, Institute Federal de Educação, Ciência e Tecnologia Sul-rio-grandense, IFSUL, Charqueadas/RS, Brazil
Fernanda Lima Kastensmidt , Institute de Informática - PGMICRO/PPGC, Universidade Federal do Rio Grande do Sul, UFRGS, Porto Alegre/RS, Brazil
Antonio Carlos Schneider Beck , Institute de Informática - PGMICRO/PPGC, Universidade Federal do Rio Grande do Sul, UFRGS, Porto Alegre/RS, Brazil
pp. 258-263

CSST: Preventing distribution of unlicensed and rejected ICs by untrusted foundry and assembly (Abstract)

Md. Tauhidur Rahman , ECE Department, University of Connecticut
Domenic Forte , ECE Department, University of Connecticut
Quihang Shi , ECE Department, University of Connecticut
Gustavo K. Contreras , ECE Department, University of Connecticut
Mohammad Tehranipoor , ECE Department, University of Connecticut
pp. 46-51

SAM: A comprehensive mechanism for accessing embedded sensors in modern SoCs (Abstract)

Miao Tony He , ECE Department, University of Connecticut
Mohammad Tehranipoor , ECE Department, University of Connecticut
pp. 240-245

Reusing the IEEE 1500 design for test infrastructure for security monitoring of Systems-on-Chip (Abstract)

Jerry Backer , Polytechnic School of Engineering, New York University, Brooklyn NY, 11201
David Hely , Université Grenoble Alpes, LCIS, F-26000, Valence, France
Ramesh Karri , Polytechnic School of Engineering, New York University, Brooklyn NY, 11201
pp. 52-56

Aging analysis for recycled FPGA detection (Abstract)

Halit Dogan , Electrical and Computer Engineering, University of Connecticut
Domenic Forte , Electrical and Computer Engineering, University of Connecticut
Mark Mohammad Tehranipoor , Electrical and Computer Engineering, University of Connecticut
pp. 171-176

Fault tolerant and highly adaptive routing for 2D NoCs (Abstract)

Manoj Kumar , Malaviya National Institute of Technology, Jaipur, India
Vijay Laxmi , Malaviya National Institute of Technology, Jaipur, India
Manoj Singh Gaur , Malaviya National Institute of Technology, Jaipur, India
Masoud Daneshtalab , University of Turku, Turku, Finland
Masoumeh Ebrahimi , University of Turku, Turku, Finland
Mark Zwolinski , University of Southampton, Southampton, United Kingdom
pp. 104-109

Diagnosis of segment delay defects with current sensing (Abstract)

Wisam Aljubouri , ECE Department, Southern Illinois University, Carbondale, IL 62901, USA
Ahish Mysore Somashekar , ECE Department, Southern Illinois University, Carbondale, IL 62901, USA
Themistoklis Haniotakis , ECE Department, Southern Illinois University, Carbondale, IL 62901, USA
Spyros Tragoudas , ECE Department, Southern Illinois University, Carbondale, IL 62901, USA
pp. 122-127

Shortest path reduction in a class of uniform fault tolerant networks (Abstract)

Prashant D. Joshi , Austin, Texas
Said Hamdioui , Delft University of Technology, Delft, The Netherlands
pp. 234-239

Improved correction for hot pixels in digital imagers (Abstract)

Glenn H. Chapman , School of Engineering Science, Simon Fraser University, Burnaby, B.C., Canada, V5A 1S6
Rohit Thomas , School of Engineering Science, Simon Fraser University, Burnaby, B.C., Canada, V5A 1S6
Rahul Thomas , School of Engineering Science, Simon Fraser University, Burnaby, B.C., Canada, V5A 1S6
Israel Koren , Dept. of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, 01003
Zahava Koren , Dept. of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, 01003
pp. 116-121

Security methods in fault tolerant modified line graph based networks (Abstract)

Prashant D. Joshi , Austin, Texas
Said Hamdioui , Delft University of Technology Delft, The Netherlands
pp. 57-62

Triggering Trojans in SRAM circuits with X-propagation (Abstract)

Senwen Kan , Advanced Micro Devices 7171 Southwest Parkway Austin, TX 78735 USA
Jennifer Dworak , Lyle School of Computer Science and Engineering, Southern Methodist University, P O Box 750339, Dallas, TX 75275-0339
pp. 1-8

A runtime manager for gracefully degrading SoCs (Abstract)

Stavros Tzilis , Computer Science and Engineering Department, Chalmers University of Technology, Gothenburg, Sweden
Ioannis Sourdis , Computer Science and Engineering Department, Chalmers University of Technology, Gothenburg, Sweden
pp. 216-221

Oxide based resistive RAM: ON/OFF resistance analysis versus circuit variability (Abstract)

H. Aziza , IM2NP-UMR CNRS 7334, Aix-Marseille Université, Marseille, France
H. Ayari , IM2NP-UMR CNRS 7334, Aix-Marseille Université, Marseille, France
S. Onkaraiah , IM2NP-UMR CNRS 7334, Aix-Marseille Université, Marseille, France
J-M. Portal , IM2NP-UMR CNRS 7334, Aix-Marseille Université, Marseille, France
M. Moreau , IM2NP-UMR CNRS 7334, Aix-Marseille Université, Marseille, France
M. Bocquet , IM2NP-UMR CNRS 7334, Aix-Marseille Université, Marseille, France
pp. 81-85
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