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Electronic Design, Test and Applications, IEEE International Workshop on (2011)
Queenstown, New Zealand
Jan. 17, 2011 to Jan. 19, 2011
ISBN: 978-0-7695-4306-2
TABLE OF CONTENTS
Papers

[Front cover] (PDF)

pp. C1

Title Page i (PDF)

pp. i

Title Page iii (PDF)

pp. iii

Table of contents (PDF)

pp. v-ix

Author Index (PDF)

pp. 287-288
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